Standards

The Test Technology Technical Council supports the development and maintenance of several IEEE standards.

The following is an overview of Test Technology standards:

IEEE P1450.6-2

Standard for Memory Modeling in Core Test Language (CTL)Saman ADHAM, saman@logicvision.com

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IEEE 1450.6-2005

Extensions to STIL for Core Test Language (CTL) SupportRohit KAPUR, rkapur@synopsys.com

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IEEE P1450.7

Extensions to STIL for Analog and Mixed Signal EnvironmentsJean-Louis CARBONERO, jean-louis.carbonero@st.com

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IEEE 1500

Embedded Core TestYervant ZORIAN, y.zorian@computer.org

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IEEE 1532

In-System Configuration of Programmable DevicesNeil JACOBSON, neil.jacobson@xilinx.com

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IEEE P1581

Static Component Interconnection Test Protocol and Architecture (SCITT)Heiko EHRENBERG, h.ehrenberg@goepel.com

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IEEE P1687

IJTAGKenneth POSSE, kepos@comcast.netAlfred CROUCH, al.crouch@inovys.com

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IEEE P1838

Test Access Architecture for Three-Dimensional Stacked Integrated CircuitsErik Jan Marinissen, erik.jan.marinissen@imec.be

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