RF Test

Technical Activity Committee on RF Testing

TAC Chair:  Iboun Taimiya SYLLA, isylla@ti.com

The rapid growth in the Wireless communication market has introduced many challenges to the IC design and test community. On one hand, in order to keep up with the market trend, design engineers must be able to produce highly integrated circuits; and on the other hand the test community has the challenge of producing innovative test solutions for these ICs that are more and more combining test challenge of digital, Mixed-Signal and RF. Many questions remained unanswered while operating in RF and Microwave domain.

Among those questions two are the most famous:

  • What should be the overall test strategy for that type of circuits and system?
  • Should we change our mindset when testing RF circuits and systems?

The scope of this Committee is to initiate actions that will help test engineers understand and answer these questions, and help them tackle the challenges lying ahead.

Through the RF Test topics at International Test Conference and within The Wireless Test Workshop the Committee is participating to create a vast forum of RF test solutions developers. The Committee is exploring other Activities that might enhance RF testing.

Upcoming conferences and symposia

IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS) 2024

Submission of title, abstract, and author list: 23 February, 2024
Final Paper Submission: 29 February, 2024
Author Notification: 09 April, 2024
Conference Dates: July 3 – 5, 2024

IEEE European Test Symposium (ETS) 2024
Paper registration: December 8, 2023
Paper PDF upload: December 16, 2023
Notification: February 16, 2024
Conference: May 20-24, 2024

IEEE VLSI Test Symposium (VTS) 2024
Paper registration: October 9, 2023
Paper PDF upload: October 15, 2023
Questions to authors: December 9, 2023
Submission of rebuttal: December 14, 2023
Notification: December 23, 2023
Camera-ready upload: February 03, 2024
Conference: April 22-24, 2024