RF Test

Technical Activity Committee on RF Testing

TAC Chair:  Iboun Taimiya SYLLA, isylla@ti.com

The rapid growth in the Wireless communication market has introduced many challenges to the IC design and test community. On one hand, in order to keep up with the market trend, design engineers must be able to produce highly integrated circuits; and on the other hand the test community has the challenge of producing innovative test solutions for these ICs that are more and more combining test challenge of digital, Mixed-Signal and RF. Many questions remained unanswered while operating in RF and Microwave domain.

Among those questions two are the most famous:

  • What should be the overall test strategy for that type of circuits and system?
  • Should we change our mindset when testing RF circuits and systems?

The scope of this Committee is to initiate actions that will help test engineers understand and answer these questions, and help them tackle the challenges lying ahead.

Through the RF Test topics at International Test Conference and within The Wireless Test Workshop the Committee is participating to create a vast forum of RF test solutions developers. The Committee is exploring other Activities that might enhance RF testing.

Conferences and symposia

19th IEEE Workshop on Silicon Errors in Logic – System Effects (SELSE) 2023

Paper registration: December 23, 2022
Paper submission: January 9, 2023

IEEE European Test Symposium 2023
Title+Abstract: December 9, 2022
Paper: December 16, 2022

IEEE VLSI Test Symposium 2023
Title+Abstract: November 5, 2022
Paper: November 11, 2022

DATE 2023
Title+abstract: September 18, 2022 (AoE)
Paper: September 25, 2022 (AoE)

IEEE Asian Test Symposium 2022
Abstract & Full Paper Submission Deadline: July 1st, 2022 (AoE)

ITC India 2022
Abstract & Full Paper Submission Deadline: May 9th, 2022

IOLTS 2022
Paper submission: May 10, 2022

LATS 2022
Title+abstract: May 6, 2022
Paper: May 13, 2022