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IEEE P1838

October 21, 2014

Test Access Architecture for Three-Dimensional Stacked Integrated Circuits
Erik Jan Marinissen, erik.jan.marinissen@imec.be

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The Test Technology Technical Community (TTTC) shall consist of all aspects of test as they pertain to test implementation, test design, manufacturing test and standardization in semiconductor, software, magnetic and optical devices and systems. Specific technical areas of interest include test of analog, digital and memory semiconductor integrated circuits, automatic test program generation, testability methods, built-in-test structures, automatic test equipment, board and system test procedures, hardware test algorithm development, synthesis algorithm development for hardware test and design integration, software test methods, magnetic storage system test, test of optical devices and systems, manufacturing test at all fabrication levels and field service testing. TTTC provides educational programs which include conferences, symposia, workshops and tutorials. TTTC maintains information and communication amongst the membership to include publications and newsletters.

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