Membership

TTTC’s goals are to contribute to its members’ professional development and advancement, to help them solve engineering problems in electronic test, and to help advance the state-of-the art. All TTTC activities are led by volunteer members.

Membership in TTTC is open to all individuals interested in test engineering at a professional level.

There are NO dues for TTTC membership and noparent-organization membership requirements; however, there are substantial reductions in fees for TTTC-sponsored meetings and tutorials for members of IEEE and/or IEEE Computer Society. (IEEE and IEEE/CS do have member fees.)

In addition to the benefits of personal association with other test professionals and the opportunity to serve on a wide range of committees, TTTC members receive TTTC Newsletters and announcements. ID-10061288TTTC sponsors a number of Technical Activity Committees that address emerging test technology topics. These TACs guide a wide range of activities in their topic areas, including standards activities and technical meetings.

Under TAC guidance, TTTC initiates, nurtures and encourages new test standards. TTTC-initiated groups have produced numerous IEEE standards, including the 1149 series used throughout the industry. TTTC also sponsors several well-known conferences and symposia and holds numerous regional and topical workshops. In addition to spreading technical knowledge about test, TTTC meetings help advance the state-of-the-art. TTTC also sponsors tutorials on current and emerging test topics in conjunction with its larger meetings.

The TTTC Web Site at http://tab.computer.org/tttc offers samples of the TTTC Newsletter, information about technical activities, conferences, workshops and standards, and gives links to the Web pages of a number of TTTC-sponsored technical meetings as well as a link to a membership home page directory.

Andre Ivanov, ivanov@ece.ubc.ca

 

Conferences and symposia

19th IEEE Workshop on Silicon Errors in Logic – System Effects (SELSE) 2023

Paper registration: December 23, 2022
Paper submission: January 9, 2023

IEEE European Test Symposium 2023
Title+Abstract: December 9, 2022
Paper: December 16, 2022

IEEE VLSI Test Symposium 2023
Title+Abstract: November 5, 2022
Paper: November 11, 2022

DATE 2023
Title+abstract: September 18, 2022 (AoE)
Paper: September 25, 2022 (AoE)

IEEE Asian Test Symposium 2022
Abstract & Full Paper Submission Deadline: July 1st, 2022 (AoE)

ITC India 2022
Abstract & Full Paper Submission Deadline: May 9th, 2022

IOLTS 2022
Paper submission: May 10, 2022

LATS 2022
Title+abstract: May 6, 2022
Paper: May 13, 2022