Category: Standards

The Test Technology Technical Community supports the development and maintenance of several IEEE standards.

The following is an overview of Test Technology standards:

  • IEEE 1149.1

    Test Access Port and Boundary-ScanChristopher J. CLARK, Cclark@intellitech.com

  • IEEE 1149.4

    Mixed Signal Test BusBambang SUPARJO, bambang_suparjo@mentor.com

  • IEEE 1149.6

    Boundary Scan Testing of Advanced Digital NetworksBill EKLOW, beklow@cisco.com

  • IEEE P1149.7

    Standard for Reduced-pin and Enhanced-functionality Test Access Port and Boundary Scan ArchitectureRobert OSHANA, robert.oshana@freescale.com

  • IEEE 1450-1999

    Standard Tester Interface Language (STIL)Gregory MASTON, gmaston@synopsys.com

  • IEEE 1450.1

    Extensions to STIL for Semiconductor Design EnvironmentTony TAYLOR, t.taylor@ieee.org

  • IEEE 1450.2-2002

    Extensions to STIL for DC Level SpecificationGregg WILDER, gwilder@ti.com

  • IEEE P1450.3

    Extensions to STIL for Tester Target SpecificationTony TAYLOR, t.taylor@ieee.org

  • IEEE P1450.4

    Extensions to STIL for Test Flow SpecificationDoug SPRAGUE, dsprauge@us.ibm.comJim O’REILLY, jim_oreilly@ieee.org

  • IEEE P1450.6-1

    Standard for Describing On-Chip Scan CompressionBruce CORY, bcory@nvidia.com