TTTC JETTA Best Paper Award

The Award is given annually to the best paper appeared in the Journal of Electronic Testing (JETTA) published by Springer. An award committee appointed by the TTTC each year selects a paper judged as the best among those published in all issues of JETTA that year. The authors of the winning paper will receive a certificate at a TTTC-sponsored event along with a cash prize from Springer.

Recipients of the JETTA-TTTC Best Paper Award for 2013 are Amitabh Das, Jean Da Rolt, Santosh Ghosh, Stefaan Seys, Sophie Dupuis, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre and Ingrid Verbauwhede. Their paper “Secure JTAG Implementation Using Schnorr Protocol” appeared in JETTA, Volume 29, Number 2, pages 193–209, April 2013.

Conferences and symposia

19th IEEE Workshop on Silicon Errors in Logic – System Effects (SELSE) 2023

Paper registration: December 23, 2022
Paper submission: January 9, 2023

IEEE European Test Symposium 2023
Title+Abstract: December 9, 2022
Paper: December 16, 2022

IEEE VLSI Test Symposium 2023
Title+Abstract: November 5, 2022
Paper: November 11, 2022

DATE 2023
Title+abstract: September 18, 2022 (AoE)
Paper: September 25, 2022 (AoE)

IEEE Asian Test Symposium 2022
Abstract & Full Paper Submission Deadline: July 1st, 2022 (AoE)

ITC India 2022
Abstract & Full Paper Submission Deadline: May 9th, 2022

IOLTS 2022
Paper submission: May 10, 2022

LATS 2022
Title+abstract: May 6, 2022
Paper: May 13, 2022