IEEE Design & Test is the TTTC sponsored flagship magazine.

The Test Technology Technical Community (ex Council) is a volunteer professional organization sponsored by the IEEE Computer Society.

TTTC’s goals are to contribute to our members’ professional development and advancement, to help them solve engineering problems in electronic test, and to help advance the state-of-the art.

In particular, TTTC aims at facilitating the knowledge flow in an integrated manner, to ensure overall quality in terms of technical excellence, fairness, openness, and equal opportunities.

All TTTC activities are led by volunteer members.

For further information, please email the TTTC Chair

Upcoming conferences and symposia

IEEE VLSI Test Symposium 2024
Paper registration: October 9, 2023
Paper PDF upload: October 15, 2023
Questions to authors: December 9, 2023
Submission of rebuttal: December 14, 2023
Notification: December 23, 2023
Camera-ready upload: February 03, 2024

ITC 2023
Paper title/abstract due: March 20, 2023 extended to April 3, 2023
Paper final PDF due: April 3, 2023 extended to April 17, 2023
Author notification: June 12, 2023 delayed until June 23, 2023
Final manuscript due: July 17, 2023
Authors are also invited to submit a single-page poster prop

IOLTS 2023
Title and Abstract registration: March 23, 2023
Paper submission: March 27, 2023
Notification of acceptance: May 10, 2023
Camera Ready: June 07, 2023

19th IEEE Workshop on Silicon Errors in Logic – System Effects (SELSE) 2023
Paper registration: December 23, 2022
Paper submission: January 9, 2023

IEEE European Test Symposium 2023
Title+Abstract: December 9, 2022
Paper: December 16, 2022

DATE 2023
Title+abstract: September 18, 2022 (AoE)
Paper: September 25, 2022 (AoE)

IEEE Asian Test Symposium 2022
Abstract & Full Paper Submission Deadline: July 1st, 2022 (AoE)

ITC India 2022
Abstract & Full Paper Submission Deadline: May 9th, 2022

LATS 2022
Title+abstract: May 6, 2022
Paper: May 13, 2022