TTTC Jan Hlavicka Memorial Award

This award is granted to an outstanding paper by an East European first author, and published in a TTTC-sponsored technical meeting.
This award honors the memory of Prof. Jan Hlavicka, a reknowned technologist who established and led the test community in East Europe.


Contact the TTTC Lifetime Awards Committee Chair Yervant ZORIAN

Past recipients

Name Year Description Location
Michal Kopec,
Tomasz Garbolino,
Krzysztof Gucwa,
Andrzej Hlawiczka
2006 For the paper “Test-per-Clock Detection, Localization and Identification of Interconnect Faults” ETS’06

Conferences and symposia

19th IEEE Workshop on Silicon Errors in Logic – System Effects (SELSE) 2023

Paper registration: December 23, 2022
Paper submission: January 9, 2023

IEEE European Test Symposium 2023
Title+Abstract: December 9, 2022
Paper: December 16, 2022

IEEE VLSI Test Symposium 2023
Title+Abstract: November 5, 2022
Paper: November 11, 2022

DATE 2023
Title+abstract: September 18, 2022 (AoE)
Paper: September 25, 2022 (AoE)

IEEE Asian Test Symposium 2022
Abstract & Full Paper Submission Deadline: July 1st, 2022 (AoE)

ITC India 2022
Abstract & Full Paper Submission Deadline: May 9th, 2022

IOLTS 2022
Paper submission: May 10, 2022

LATS 2022
Title+abstract: May 6, 2022
Paper: May 13, 2022