GROUP CHAIR
Adam CRON
Synopsys, Inc. – USA
Tel: +1-650-584-1487
Email: Adam.Cron@synopsys.com

IEEE 1149.1 – Test Access Port and Boundary-Scan Committee Chair
Christopher J. CLARK
Intellitech Corporation – USA
Tel:
Email: Cclark-at-intellitech-dot-com

IEEE 1149.4 – Mixed-Signal Test Bus Committee Chair
Adam OSSEIRAN
Edith Cowan University – Australia
Tel: +61-8-6304 5752
Email: a.osseiran@ecu.edu.au

IEEE 1149.5 – Module Test & Maintenance Bus Committee Chair
Harry HULVERSHORN
LogicVision, Inc. – USA
Tel: +1-408-453-0146
Email: harryh@logicvision.com

IEEE 1450 – Standard Test Interface Language (STIL) Committee Co-Chair
Gregory MASTON
Synopsys, Inc. – USA
Tel: +1-303-748-2584
Email: gmaston@synopsys.com

IEEE 1450 – Standard Test Interface Language (STIL) Committee Co-Chair
Tony TAYLOR

Tel: t.taylor@ieee.org
Email: t.taylor@ieee.org

IEEE P1500 – Standard for Embedded Core Test (SECT) Committee Chair
Yervant ZORIAN
Synopsys
Tel: +1-650-584-7120
Email: y.zorian@computer.org

IEEE 1532 – Standard for In-System Configuration (ISC) of Programmable Devices Committee Chair
Neil JACOBSON
Xilinx Corp. – USA
Tel: +1-408-879-4885
Email: neil.jacobson@xilinx.com