- The International Test Conference(ITC) is the cornerstone of TestWeek™ events, is the world’s premier conference dedicated to the electronic test of devices, boards and systems-covering the complete cycle from design verification, test, diagnosis, failure analysis and back to process and design improvement. At ITC, test and design professionals can confront the challenges the industry faces, and learn how these challenges are being addressed by the combined efforts of academia, design tool and equipment suppliers, designers, and test engineers.
- Design, Automation and Test in Europe Conference (DATE)
The DATE conference and exhibition is the main European event bringing together designers and design automation users, researchers and vendors, as well as specialists in the hardware and software design, test and manufacturing of electronic circuits and systems. DATE puts a strong emphasis on both technology and systems, covering ICs/ SoCs, reconfigurable hardware and embedded systems, and embedded software.
The five-day event consists of a conference with plenary invited papers, regular papers, panels, hot-topic sessions, tutorials and workshops, two special focus days and a track for executives. The scientific conference is complemented by a commercial exhibition showing the state-of-the-art in design and test tools, methodologies, IP and design services, reconfigurable and other hardware platforms, embedded software, and (industrial) design experiences from different application domains, e.g. automotive, IoT, wireless, telecom and multimedia applications. The organisation of user group meetings, fringe meetings, a university booth, a PhD forum, vendor presentations and social events offers a wide variety of extra opportunities to meet and exchange information on relevant issues for the design and test community. Special space will also be allocated for EU-funded projects to show their results.
Conferences and symposia
19th IEEE Workshop on Silicon Errors in Logic – System Effects (SELSE) 2023
Paper registration: December 23, 2022
Paper submission: January 9, 2023
IEEE European Test Symposium 2023
Title+Abstract: December 9, 2022
Paper: December 16, 2022
IEEE VLSI Test Symposium 2023
Title+Abstract: November 5, 2022
Paper: November 11, 2022
DATE 2023
Title+abstract: September 18, 2022 (AoE)
Paper: September 25, 2022 (AoE)
IEEE Asian Test Symposium 2022
Abstract & Full Paper Submission Deadline: July 1st, 2022 (AoE)
ITC India 2022
Abstract & Full Paper Submission Deadline: May 9th, 2022
IOLTS 2022
Paper submission: May 10, 2022
LATS 2022
Title+abstract: May 6, 2022
Paper: May 13, 2022