2013 Finals held at International Test Conference (ITC)
Session Chair: Yervant Zorian (Synopsys, USA)
Global Coordinator: Michele Portolan (Université Grenoble Alpes, France)
- Suraj Sindia, “High sensitivity test signature for unconventional analog circuit test paradigms”, (Auburn University, Alabama, AL, USA, Advisor: Prof. Vishwani Agrawal).
Title: Online Timing Variation Detection and Tolerance for Digital Integrated Circuits
- Louay Abdallah, “Non-intrusive embedded sensors for RF circuit test”, (Université Grenoble Alpes, TIMA Lab, Advisor: Salvador Mir and Haralampos Stratigopoulos)
- Ke Huang, “Fault Modelling and Diagnosis for Nanometric Analog/Mixed-Signal/RF Circuits”, (Université Grenoble Alpes, TIMA Lab, Advisor: Salvador Mir and Haralampos Stratigopoulos)
Jury members for the Final:
Chen-Huan Chiang (Alcatel-Lucent, USA)
Erik Jan Marinissen (IMEC, Belgium)
Amit Majumdar (Xilinx, USA)
Sule Ozev (Arizona State University, USA)
Makoto Nagata (Kobe University, Japan)
Brendan Mullane (University of Limerick, Ireland)
Semi-final jury members:
Local Coordinator for VTS: Michail Maniatakos (NYUAD, UAE)
Local Coordinator for ETS: Jaan Raik (Tallin University, Estonia)
Local Coordinator for ATS: Virendra Singh (Indian Institute of Technology Bombay, India)
Dan Alexandrescu (iROC, France)
Shawn Blanton (Carnegie Mellon, US)
Krishnendu Chakrabarty (Duke University, US)
Jennifer Dworak (Southern Methodist University, US)
Said Hamdioui (Delft University, The Netherlands )
Xinli Gu (Huawei, US )
Johan Karlsson (Chalmers University, Sweden)
Prabhakar Kudva (IBM, US)
Hans Manhaeva (Ridgetop, Belgium )
Suryia Natarajan (Intel, US)
Janusz Rajski (Mentor Graphics, US)
Ozgur Sinanoglu (NYUAD, UAE)
Peilin Song (IBM)