TTTC’s E. J. McCluskey Best Doctoral Thesis Award

The Award serves the purpose to promote most impactful doctoral student work, to provide the students with the exposure to the community and the prospective employers, and to support interaction between academia and industry in the field of test technology. The Award is given to the winner of a two-stage contest with semi-finals held at TTTC-sponsored conferences, symposia or workshops. The winners of the semi-finals, determined by jurys composed of industrial experts, will compete against each other in the finals, held at a major TTTC-sponsored conference or symposium. This major Award is named after Prof. Edward J. McCluskey, a key educator and mentor in the fields of test technology, logic design, and reliability.

Call for Participation 2022

We are happy to announce that in 2022, the Contest will be coming held in 4 locations: the  Asian Test Symposium, the European Test Symposium, the Latin-America Test Symposium and the  VLSI Test Symposium

Because of ATS is held after or really close to ITC, the Asian a semi-final for the TTTC’s E. J. McCluskey Best Doctoral Thesis Award will be held in 2021.

All active doctoral students working on test-related topics and recent graduates who graduated in 2020 or later are eligible for the Award. An individual can only participate in the contest once in a lifetime. Prospective participants are encouraged to participate when they are close to thesis completion and have obtained sufficient results.

Prospective contestants submit a summary of their thesis work (up to 2000 words), possibly accompanied by one additional page of figures and references. They are free to submit up to three published referenced as supporting material, which are considered by the jury on an optional basis. The abstract should clearly address the following:

  • define the problem and its relevance to industry,
  • describe existing industrial practices for solving the problem, and
  • explain the proposed methodology (and any pertinent case study) and how it advances the theory and/or practice in the particular field.
  • A student can freely choose the regional (semi-finals) site to submit the summary. Submissions to multiple regional sites are prohibited.

The 4 semi-finals sites for the Best Doctoral Thesis Award 2022:

  1. VLSI Test Symposium 2022, (VTS’22), local coordinator Ujjwal Guin
  2. European Test Symposium 2022 (ETS’22), local coordinators Alessandro Savino, Alberto Bosio
  3. Latin Americ Test Symposium 2022 (LATS’22), local coordinator TBD
  4. Asian Test Symposium 2021 (ATS’21), local coordinator Hiroshi Takahashi

For submission information, please refer to the Local Coordinator at the conference website. Each Semi-Final has its own local rules: please refer to the Local Coordinator for detailed submission instructions.

For general inquiries, direct your questions to the Global Coordinator,  Michele Portolan (Grenoble-INP, France).

Based on the submitted abstracts, a set of semi-finalists will be selected for the semi-finals of the contest. Semi-finals could be canceled if the numbers of submissions is inadequately low, in which case candidates will be invited to take part in another semi-final. Each Semi-Final has its own local rules: please refer to the Local Coordinator for detailed submission instructions. This round usually includes a short (seven-minute) slot for oral presentation during a dedicated session at the semi-final event. The jury will judge the presentations, and the winner of the semi-final will be announced during the event.

The finalists will be invited to submit a summary of their thesis to be included in the ITC’22 Proceedings, and present their work in a dedicated Session. The winner will be determined by a panel of academic and industrial experts. The Award is given to the winning student and the advisor of the thesis.

NAME AFFILIATION YEAR RESULT THESIS TITLE
Lizhou Wu Delft University of Technology, Netherlands 2021 Winner Testing STT-MRAM: Manufacturing Defects, Fault Models, and Test Solutions
Mengyun Liu Duke University, USA 2021 Finalist Adaptive Methods for Machine Learning-Based Testing of Integrated Circuits and Boards
Foisal Ahmed Nara Institute of Science and Technology (NAIST), Japan  2021 Finalist Study on High-Accuracy and Low-Cost Recycled FPGA Detection
Mohammad Nasim Imtiaz Khan The Pennsylvania State University, USA 2020 Winner Assuring Security and Reliability of Emerging Non-Volatile Memories
Sarah Azimi Politecnico di Torino, Italy 2020 Finalist Digital Design Techniques for Dependable High Performance Computing
Rajit Karmakar Department of E&ECE, Indian Institute of Technology Kharagpur, India 2020 Finalist Hardware IP Protection Using Logic Encryption and Watermarking
Rafael B. Schvittz Federal University of Pelotas – UFPEL, Brazil  2020 Finalist Methods for Susceptibility Analysis of Logic Gates in the Presence of Single Event Transients
Tao Chen Iowa State University, USA 2019 Winner Thesis title: Built-in Self-Test and Self-Calibration for Analog and Mixed Signal Circuits
Innocent Okwudili Delft University of Technology, Netherlands 2019 Finalist Reliability Modeling and Mitigation for Embedded Memories
Francisco E. Rangel-Patiño The Jesuit University of Guadalajara,  Mexico 2018 Winner Transmitter and Receiver Equalizers Optimization Methodologies for High-Speed Links in Industrial Computer Platforms Post-Silicon Validation
Muhammad Yasin New York University Tandon School of Engineering 2018 Finalist Towards Provably Secure Logic Locking for Hardening Hardware Security
Justyna Zawada Poznań University of Technology, Poland 2018 Finalist On New Class of Test Points and Their Applications
Fakir Sharif Hossain Graduate School of Information Science Department of Computer Science and Engineering Nara Institute of Science and Technology, Japan 2018 Finalist Variation-Aware Hardware Trojan Detection through Power Side-channel
Yuming Zhuang Iowa State University 2017 Winner Accurate and Robust Spectral Testing with Relaxed Instrumentation Requirements
Surajit Kumar Roy Indian Institute of Engineering Science and Technology 2017 Finalist Design-for-Test and Test Optimisation for 3D SOCs
Boyang Du Politecnico di Torino 2017 Finalist Fault-tolerant Electronic System Design
Ran Wang Duke University 2016 Winner Testing of Interposer-Based 2.5D Integrated Circuits
Eduardo Chielle Federal University of Rio Grande Do Sul (UFGRS) 2016 Finalist Selective Software-Implemented Hardware Fault Tolerance Techniques to Detect Soft Errors in Processors with Reduced Overhead​
Panagiota Papavramidou Université Grenoble Alpes, TIMA Lab 2016 Finalist Memory repair architectures for high defect densities
Lien Wei-Cheng Dept. of Electrical Engr., National Cheng Kung University, Taiwan 2016 Finalist Output bit selection methodology for test response compaction
Fabian Oboril KIT Karlsruhe 2015 Winner Cross-Layer Approaches for an Aging-Aware Design of Nanoscale Microprocess
Sergej Deutsch Duke University 2015 Finalist Test and Debug Solutions for 3D-Stacked Integrated Circuits
Li Jiang The Chinese University of Hong Kong 2015 Finalist Yield and reliability enhancement for 3D ICs
Samah Saeed NYU  Polytechnic School of Engineering 2014 Winner DfT Approaches and Security Challenges in the Scan Design
Luca Cassano University of Pisa, Italy 2014 Finalist Analysis and Test of the Effects of Single Event Upsets Affecting the Configuration Memory of SRAM-based FPGAs
Julio César Vázquez Hernández National Institute for Astrophysics Optics and Electronics (INAOE), Mexico 2014 Finalist Aging Robust Monitoring and Techniques to Improve Performance on Digital Systems
Louay Abdallah Université Grenoble Alpes, TIMA Lab 2013 Winner Non-intrusive embedded sensors for RF circuit test
Suraj Sindia Auburn University, Alabama, AL, USA 2013 Finalist High sensitivity test signature for unconventional analog circuit test paradigms
Ke Huang Université Grenoble Alpes, TIMA Lab 2013 Finalist Fault Modelling and Diagnosis for Nanometric Analog/Mixed-Signal/RF Circuits
Nathan Kupp Yale University 2012 Winner Integrated Optimization of Semiconductor Manufacturing: A Machine Learning Approach
Darius Szysz TU Poznan 2012 Finalist Low power test application with selective compaction in VLSI designs
Wing-Chiu Tam Carnegie Mellon University, USA 2011 Winner Physically-Aware Analysis of Systematic Defects in Integrated Circuits
Urban Ingelsson University of Southampton, UK 2011 Finalist Investigations into Voltage and Process Variation-Aware Manufacturing Test
Guihai Yan ICT Bejing 2011 Finalist Online Timing Variation Tolerance for Digital Integrated Circuits