TTTC Bob Madge Innovation Award

The Bob Madge Innovation Award will recognize “Innovation that Matters” in the area of Semiconductor Design, Test and Data Analysis. Nominations are invited from all active researchers, academicians and industry personnel for this award instituted in the respectful and loving memory of our colleague, Bob Madge (1963-2014).
The award will celebrate exemplary research that meets the following criteria:

  • True innovation that is changing the industry
  • Solutions that challenge existing approaches
  • Fosters broad adaptation and open collaboration

The nominations must be for research work concluded or with significant results published in the past 5-8 years. This annual award will include an honorarium, memento and will be presented at the International Test Conference (www.itctestweek.org). The selection committee is a diverse team representing a cross section of renowned industry and university researchers.

Information about the award program, requirements and the nomination form can be accessed here.

Please see below for key dates.

  • June 15, 2015 – Call for nominations.
  • Aug 01, 2015 – Nomination submissions closed.
  • August 20, 2015 – Selection committee makes final decision.
  • October 06, 2015 – Winner announced at ITC, 2015.

Thank you very much for your nominations. We look forward to celebrating your Innovation at the International Test Conference in October 2015.

Please contact Phil Nigh (nigh@us.ibm.com) or Rao Desineni (rao.desineni@globalfoundries.com) if you have any questions about this award program.

Upcoming conferences and symposia

IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS) 2024

Submission of title, abstract, and author list: 23 February, 2024
Final Paper Submission: 29 February, 2024
Author Notification: 09 April, 2024
Conference Dates: July 3 – 5, 2024

IEEE European Test Symposium (ETS) 2024
Paper registration: December 8, 2023
Paper PDF upload: December 16, 2023
Notification: February 16, 2024
Conference: May 20-24, 2024

IEEE VLSI Test Symposium (VTS) 2024
Paper registration: October 9, 2023
Paper PDF upload: October 15, 2023
Questions to authors: December 9, 2023
Submission of rebuttal: December 14, 2023
Notification: December 23, 2023
Camera-ready upload: February 03, 2024
Conference: April 22-24, 2024