Should I join?

The Test Technology Technical Community is a volunteer professional organization sponsored by the IEEE Computer Society. TTTC has put this page together to give you some basic information about TTTC to help you determine if you should join.

Membership in the Test Technical is available at no charge to all individuals interested at the professional level in the technology of semiconductor test. Members find it highly valuable to contribute their time and expertise to the continued advancement of this very exciting field. To this end, TTTC sponsors or co-sponsors a large number of conferences, symposia, and workshops.

These TTTC-sponsored events also provide opportunities to gather groups of individuals interested in specific topics in small “fringe meetings”, that may launch development of new standards activities or perhaps additional workshops focused on new technologies or technical challenges. Standards groups frequently consist of a dozen or so highly skilled technical individuals who would have relatively little chance to gather in a collegial environment without the penumbra cast by the larger symposium or conference.

TTTC members have developed lasting friendships, collaborations, and associations through these TTTC-sponsored events, and have gained opportunities to grow and develop their own expertise, and to guide and mentor that of younger colleagues, by participating in these various events.

The TTTC Web Site offers samples of the TTTC Newsletter, information about technical activities, conferences, workshops and standards, and gives links to the Web pages of a number of TTTC-sponsored technical meetings.

Michael Nicolaidis <michael.nicolaidis@imag.fr>

Upcoming conferences and symposia

IEEE VLSI Test Symposium (VTS) 2026
Submission deadline: December 5, 2025
Notification: January 24, 2026
Camera-ready upload: February 28, 2026
Conference: April 27-29, 2026

IEEE European Test Symposium (ETS) 2026
Submission of title, abstract, authors: 15 December 2025
Full paper submission: 12 January 2026
Notification of acceptance: 20 February 2026
Camera-ready manuscript: Deadline: 22 March 2026
Conference: May 25-29, 2026

IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS) 2026

Submission of title, abstract, and authors: March 1, 2026
Final Paper Submission: March 8, 2026
Author Notification: April 12, 2026
Conference Dates: July 1 – 3, 2026

International Test Conference (ITC) 2026
Paper title/abstract due: March 20, 2026
Paper final PDF due: April 24, 2026
Author notification: June 19, 2026
Conference Dates: October 11 to 16, 2026

IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS) 2026
Title and abstract submissions April 24th, 2026
Full paper submissions May 1st, 2026
Notification July 10th, 2026
Camera ready and author’s registration July 24th, 2026