THE ITC/TTTC GERALD W. GORDON AWARD FOR STUDENT VOLUNTEER SERVICES

To encourage student volunteer services in the IEEE and its test community, the IEEE Test Technology Technical Council (TTTC) and the International Test Conference (ITC) are pleased sponsor the Gerald W. Gordon Award Program starting 2003. The award honors the memory of Gerald W. Gordon, a well-known leader and activist in the IEEE and its test community and a long time member of the ITC Steering Committee.

The award is granted annually for ten years (2003-2012). The award presentation will take place during ITC/Test Week.

Award Criteria

A certificate is presented annually to a current student for credible service to IEEE test technology related activities, programs and organizations. Qualification is enhanced by the level and number of contributions and dedication to service.

Invitation

Nominations for this award are solicited. Both, self-submission or nominations are accepted. Also, two to five endorsement statements are required. The Nomination Form can be downloaded by clicking here (Microsoft WORD). The nomination deadline for 2010 is July 31, 2010.

All applications will be evaluated by the dedicated G.W. Gordon Award Selection Subcommittee to consist of five members organized as part of the TTTC Awards program. For additional clarifications regarding the selection process, please do not hesitate to contact the Subcommittee CoChairs Kenneth MANDL and Yervant ZORIAN.

Award Package 

  • Certificate presentation and Announcements as described above.
  • Complimentary Registration to ITC
  • Complimentary Registration to two TTEP tutorials and one workshop held during Test Week
  • Reimbursement of travel cost up to a predetermined level
  • Lodging provided at one of the ITC Hotels

Past recipients 

Name Year Description Location
Ahmad Al-Yamani, Stanford University, Palo Alto, CA, USA 2003
Bartomeu Alorda, Univeritat de les Illes Balears, Majorca, Spain 2004
Olga Melnikova, Kharkov National University of Radio Electronics, Kharkov, Ukraine 2005
Szilard Enyedi, Technical University of Cluj-Napoca, Cluj-Napoca, Romania 2006
George Xenoulis, University of Piraeus, Greece 2007
Gurgen Harutyunyan, Yerevan State University, Armenia 2008

 

 

Upcoming conferences and symposia

IEEE VLSI Test Symposium (VTS) 2026
Submission deadline: December 5, 2025
Notification: January 24, 2026
Camera-ready upload: February 28, 2026
Conference: April 27-29, 2026

IEEE European Test Symposium (ETS) 2026
Submission of title, abstract, authors: 15 December 2025
Full paper submission: 12 January 2026
Notification of acceptance: 20 February 2026
Camera-ready manuscript: Deadline: 22 March 2026
Conference: May 25-29, 2026

IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS) 2026

Submission of title, abstract, and authors: March 1, 2026
Final Paper Submission: March 8, 2026
Author Notification: April 12, 2026
Conference Dates: July 1 – 3, 2026

International Test Conference (ITC) 2026
Paper title/abstract due: March 20, 2026
Paper final PDF due: April 24, 2026
Author notification: June 19, 2026
Conference Dates: October 11 to 16, 2026

IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS) 2026
Title and abstract submissions April 24th, 2026
Full paper submissions May 1st, 2026
Notification July 10th, 2026
Camera ready and author’s registration July 24th, 2026