Nano-based Devices

Technical Activity Committee on Testing of Nano-based Devices and Systems

TAC Chair: Fabrizio Lombardi, lombardi@ece.neu.edu

As device geometry shrinks in the nano meter range, new technologies have been proposed for the next generation of electronic systems. These innovations depart substantially from current practice because they rely on physical-based phenomena which become relevant at significantly different (atomistic and/or molecular) implementation levels.

These technologies go well beyond the reduction in device geometry to encompass new computational paradigms. Example of these devices are:

  • quantum dots,
  • carbon nanotubes,
  • silicon nanowires,
  • resonant tunneling diodes.

In the computational arena, quantum computing (inclusive of cellular automata), organic switches and tunnel logic arrays have been proposed as Nanofabric. For the foreseen future there is little doubt that these technologies will eventually have an impact on the electronic industry; in the near future their interface with CMOS will also be an important feature to be considered while integrating these technologies into commercial designs.

This TAC will be responsible for promoting different activities such as encouraging the submission, dissemination and review of technical manuscripts in this topic area within TTTC sponsored meetings as well as Special Sessions, Tutorials and Workshops to foster awareness of these issues within the technical testing community.

We envisage an active partecipation in both premier meetings of TTTC (i.e. VTS and ITC) and collaborate with other TACs on relevant workshops which drawn on an interdisciplinary coverage.

A further goal of the TAC is to collaborate with the newly formed NanoTechnology Council of the IEEE to ensure that testing is appropriately included in planned activities.

Upcoming conferences and symposia

IEEE VLSI Test Symposium (VTS) 2026
Submission deadline: December 5, 2025
Notification: January 24, 2026
Camera-ready upload: February 28, 2026
Conference: April 27-29, 2026

IEEE European Test Symposium (ETS) 2026
Submission of title, abstract, authors: 15 December 2025
Full paper submission: 12 January 2026
Notification of acceptance: 20 February 2026
Camera-ready manuscript: Deadline: 22 March 2026
Conference: May 25-29, 2026

IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS) 2026

Submission of title, abstract, and authors: March 1, 2026
Final Paper Submission: March 8, 2026
Author Notification: April 12, 2026
Conference Dates: July 1 – 3, 2026

International Test Conference (ITC) 2026
Paper title/abstract due: March 20, 2026
Paper final PDF due: April 24, 2026
Author notification: June 19, 2026
Conference Dates: October 11 to 16, 2026

IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS) 2026
Title and abstract submissions April 24th, 2026
Full paper submissions May 1st, 2026
Notification July 10th, 2026
Camera ready and author’s registration July 24th, 2026