Membership

TTTC’s goals are to contribute to its members’ professional development and advancement, to help them solve engineering problems in electronic test, and to help advance the state-of-the art. All TTTC activities are led by volunteer members.

Membership in TTTC is open to all individuals interested in test engineering at a professional level.

There are NO dues for TTTC membership and noparent-organization membership requirements; however, there are substantial reductions in fees for TTTC-sponsored meetings and tutorials for members of IEEE and/or IEEE Computer Society. (IEEE and IEEE/CS do have member fees.)

In addition to the benefits of personal association with other test professionals and the opportunity to serve on a wide range of committees, TTTC members receive TTTC Newsletters and announcements. ID-10061288TTTC sponsors a number of Technical Activity Committees that address emerging test technology topics. These TACs guide a wide range of activities in their topic areas, including standards activities and technical meetings.

Under TAC guidance, TTTC initiates, nurtures and encourages new test standards. TTTC-initiated groups have produced numerous IEEE standards, including the 1149 series used throughout the industry. TTTC also sponsors several well-known conferences and symposia and holds numerous regional and topical workshops. In addition to spreading technical knowledge about test, TTTC meetings help advance the state-of-the-art. TTTC also sponsors tutorials on current and emerging test topics in conjunction with its larger meetings.

The TTTC Web Site at http://tab.computer.org/tttc offers samples of the TTTC Newsletter, information about technical activities, conferences, workshops and standards, and gives links to the Web pages of a number of TTTC-sponsored technical meetings as well as a link to a membership home page directory.

Andre Ivanov, ivanov@ece.ubc.ca

 

Upcoming conferences and symposia

IEEE VLSI Test Symposium (VTS) 2026
Submission deadline: December 5, 2025
Notification: January 24, 2026
Camera-ready upload: February 28, 2026
Conference: April 27-29, 2026

IEEE European Test Symposium (ETS) 2026
Submission of title, abstract, authors: 15 December 2025
Full paper submission: 12 January 2026
Notification of acceptance: 20 February 2026
Camera-ready manuscript: Deadline: 22 March 2026
Conference: May 25-29, 2026

IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS) 2026

Submission of title, abstract, and authors: March 1, 2026
Final Paper Submission: March 8, 2026
Author Notification: April 12, 2026
Conference Dates: July 1 – 3, 2026

International Test Conference (ITC) 2026
Paper title/abstract due: March 20, 2026
Paper final PDF due: April 24, 2026
Author notification: June 19, 2026
Conference Dates: October 11 to 16, 2026

IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS) 2026
Title and abstract submissions April 24th, 2026
Full paper submissions May 1st, 2026
Notification July 10th, 2026
Camera ready and author’s registration July 24th, 2026