Students Activities

Students Activities

TTTC’s E. J. McCluskey Best Doctoral Thesis Award

Chair:  Michele Portolan, michele.portolan@univ-grenoble-alpes.fr

The aim of this award is to promote and strengthen the interaction between doctoral students who are close to graduation and the industrial community. It also serves as a process by which student work is exposed to and tested to real life industrial needs by experts in the field. This is achieved by student presentations in a conference environment in front of an industrial panel that has the chance to evaluate, comment and contribute to their work in terms of novelty and advance of industrial and theoretical practice. The award provides a unique opportunity to energetic young researchers to gain visibility in the international test community.
Click here for more information.

ITC University Booth (2002-2006)

The ITC University Booth provides an opportunity for the university community to demonstrate device/board/system testing research in areas including design verification, test, diagnosis, and failure analysis. The University Booth also provides space for the presentation of vendor literature and programs of interest to the university community. The University Booth provides booth space, poster areas, computers, printers, and a high-speed connection to the Internet for participating universities
University Booth 2006.
University Booth 2005.
University Booth 2003.
University Booth 2002.

Upcoming conferences and symposia

IEEE VLSI Test Symposium (VTS) 2026
Submission deadline: December 5, 2025
Notification: January 24, 2026
Camera-ready upload: February 28, 2026
Conference: April 27-29, 2026

IEEE European Test Symposium (ETS) 2026
Submission of title, abstract, authors: 15 December 2025
Full paper submission: 12 January 2026
Notification of acceptance: 20 February 2026
Camera-ready manuscript: Deadline: 22 March 2026
Conference: May 25-29, 2026

IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS) 2026

Submission of title, abstract, and authors: March 1, 2026
Final Paper Submission: March 8, 2026
Author Notification: April 12, 2026
Conference Dates: July 1 – 3, 2026

International Test Conference (ITC) 2026
Paper title/abstract due: March 20, 2026
Paper final PDF due: April 24, 2026
Author notification: June 19, 2026
Conference Dates: October 11 to 16, 2026

IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS) 2026
Title and abstract submissions April 24th, 2026
Full paper submissions May 1st, 2026
Notification July 10th, 2026
Camera ready and author’s registration July 24th, 2026