TTTC’s interests encompass a wide variety of technologies, since each area in electronic test depends on its own specialized instrumentation and techniques.

A number of technologies are usually needed to test a single product thereby increasing the challenge. TTTC’s current scope includes, but is not limited to:

• Testing of analog, digital, memory, FPGA, SiP, and RF Semiconductor circuits
• Testing of embedded cores, integrated circuits, MCMs, boards and systems
• Testability methods: built-in self-test, scan, and test synthesis
• Verification and Validation
• Embedded Test, ATE, Test resource partitioning
• Yield Optimization, defect/fault tolerance and embedded repair methodologies
• Infrastructure IP
• On-line, IDDQ, thermal testing
• Transient faults, soft errors, robustness, field reliability
• Debug and Diagnosis