Hardware Security and Trust

Technical Activity Committee on HARDWARE SECURITY AND TRUST

TAC Chair: Jim PLUSQUELLIC, jimp@ece.unm.edu
TAC Vice-Chairs: Mohammad TEHRANIPOOR, tehrani@engr.uconn.edu
Giorgio DI NATALE, giorgio.dinatale@lirmm.fr

Introduction

A wide range of applications, from secure RFID tagging to high-end trusted computing, relies on dedicated and trusted hardware platforms. The security and trustworthiness of such hardware designs are critical to their successful deployment and operation. Recent advances in tampering and reverse engineering show that important challenges lie ahead. For example, secure electronic designs may be affected by malicious circuits, Trojans that alter system operation. Furthermore, dedicated secure hardware implementations are susceptible to novel forms of attack that exploit side-channel leakage, faults, or test infrastructures. Third, the globalized, horizontal semiconductor business model raises concerns of trust and intellectual-property protection.

Topics

  • Trojan Detection and Isolation
  • Side channel Attacks and Countermeasures
  • Fault-based Attacks and Countermeasures
  • Intellectual Property Protection and Metering
  • Tools and Methodologies for Secure Hardware Design
  • Hardware Architectures for Cryptography
  • Hardware Security Primitives: PUFs and TRNGs
  • Trusted Platform and System Level Hardware Security
  • Interaction of Secure Hardware and Software
  • Non-destructive Reverse Engineering
  • CAD Tool Security and Trust
  • Supply Chain Security
  • Test and Security

 Related Events

  • HOST: IEEE International Symposium on HARDWARE-ORIENTED SECURITY and TRUST
  • IOLTS (Topics: Secure circuit design, Fault-based attacks and counter measures)
  • DATE: Conference on Design, Automation and Test in Europe
  • VTS’2011 (Session 4b: Security)
  • VTS’2010 (Special Session 11B: Hot Topic: Hardware Security: Design, Test and Verification Issues)
  • VTS’2009 (Session 11B: Emergent Technology and Security
  • Tutorials on Test and Security (LATW’09, ETS’09, DDECS’10)

Upcoming conferences and symposia

IEEE VLSI Test Symposium (VTS) 2026
Submission deadline: December 5, 2025
Notification: January 24, 2026
Camera-ready upload: February 28, 2026
Conference: April 27-29, 2026

IEEE European Test Symposium (ETS) 2026
Submission of title, abstract, authors: 15 December 2025
Full paper submission: 12 January 2026
Notification of acceptance: 20 February 2026
Camera-ready manuscript: Deadline: 22 March 2026
Conference: May 25-29, 2026

IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS) 2026

Submission of title, abstract, and authors: March 1, 2026
Final Paper Submission: March 8, 2026
Author Notification: April 12, 2026
Conference Dates: July 1 – 3, 2026

International Test Conference (ITC) 2026
Paper title/abstract due: March 20, 2026
Paper final PDF due: April 24, 2026
Author notification: June 19, 2026
Conference Dates: October 11 to 16, 2026

IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS) 2026
Title and abstract submissions April 24th, 2026
Full paper submissions May 1st, 2026
Notification July 10th, 2026
Camera ready and author’s registration July 24th, 2026