ATS 2013 - Call for Papers

CALL FOR PAPERS

Scope -- Submissions -- Key Dates -- Additional Information -- Committees

Scope

The Asian Test Symposium (ATS) provides an open forum for researchers and industrial practitioners from all countries of the world, especially from Asia, to exchange innovative ideas on system, board, and device testing with design, manufacturing and field consideration in mind.

Original papers on, but not limited to, the following areas are invited.

Automatic Test Pattern Generation
Fault Modeling and Simulation
Design Verification and Validation
Diagnosis and Debug
Board and System Test
Analog/Mixed-Signal Test
High-Speed I/O Test
RF Test
Delay and Performance Test
Memory Test/FPGA Test
System-in-Package/3D Test
Software Testing
Boundary Scan Test
Built-In Self-Test
Design-for-Testability
Test Compression
On-Line Test
Temperature/Power-Aware Testing
Defect-Based Testing
Fault Tolerance
Dependable System
Yield Analysis and Enhancement
Test Quality
Economics of Test

Submissions

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Regular Sessions: The ATS'13 Program Committee invites original, unpublished paper submissions on the above topics. Paper submissions should be complete manuscripts, not exceeding six pages (including figures, tables, and bibliography) in a standard IEEE two-column format. The submission will be considered evidence that upon acceptance the author(s) will submit a final camera-ready version of the paper for inclusion in the proceedings, and will present the paper at the symposium. The registration of at least one author is required for publication.

Special Sessions, Tutorials: Suggestions and proposals are welcome. Contact the Program Chair for more information.

Key Dates

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Submission deadline: May 24, 2013
Notification of acceptance:August 5, 2013
Final copy deadline: August 31, 2013

Additional Information

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General Information

Sying-Jyan Wang
National Chung Hsing Univ.
Tel: +886-4-2284-0497 ext. 910
email: sjwang@cs.nchu.edu.tw

Committees

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Organizing Committee

General Chair
S.-J. Wang
National Chung Hsing U.

Program Chair
J.-L. Huang
National Taiwan U.

Finance Chair
C.-M. Li
National Taiwan U.

Local Arrangement Chair
H.-P. (Charles) Wen
National Chiao Tung U.

Registration Chair
J.-J. Liou
National Tsing Hua U.

Publicity Chair
S.-K. Lu
National Taiwan U. of Science and Technology

Publication Chair
S.-J. Chang
National Cheng Kung U.

Tutorial Chair
S.-M. Li
National Sun Yat-Sen U.

North American Liaison
M. S. Hsiao
Virginia Tech., U.S.

European Liaison
S. Mir
TIMA, France

For more information, visit us on the web at: http://bug.ee.ntu.edu.tw/ATS2013

TheThe 22nd Asian Test Symposium (ATS'13) is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC).