TTTC's Electronic Broadcasting Service
VLSI Test Symposium
Submission of PDF Deadline Extended to October 21, 2011!
CALL FOR PAPERS
The IEEE VLSI Test Symposium (VTS) explores emerging trends and novel concepts in testing, and verification & validation of microelectronic circuits and systems. Major topics include, but are not limited to:
|The VTS Program Committee invites original, unpublished paper submissions for VTS 2012. Paper submissions
should be complete manuscripts, up to six pages (inclusive of figures, tables, and bibliography) in a standard IEEE two-column format; papers exceeding the page limit will be returned without review. Authors should clearly explain the significance of the work, highlight novel features, and describe its current status. On the title page, please include: author name(s) and affiliation(s), and the mailing address, phone number, fax number, and e-mail address of the contact author. A 50-word abstract and five keywords identifying the topic area are also required.
Proposals for the Innovative Practices tracks, and Special Sessions are also invited. The innovative practices track will highlight cutting-edge challenges faced by test practitioners, and innovative solutions employed to address them. Special sessions can include panels, embedded tutorials, or hot topic presentations. Innovative practices track and special session proposals should include a title, name and contact information of the session organizer(s), a 150-to-200 word abstract, and a list of prospective participants.
Detailed instructions for submissions are to be found at the conference website http://www.tttc-vts.org. A submission will be considered as evidence that, upon acceptance, the author(s) will submit a final camera-ready version of the paper for inclusion in the proceedings, and will present the paper at the symposium. The registration of at least one author is required for publication. In the case of innovative practice and special sessions, the organizers commit to submit a session title, abstract, and list of participants for inclusion in the symposium proceedings and program.
VTS 2012 will present a Best Paper Award, a Best Panel Award, and a Best IP Track Session Award based on the evaluations of reviewers, attendees, and an invited panel of judges. We also plan to organize a Student Poster Competition and a TTTC Best Doctoral Thesis Contest, details will be available later. The best papers of VTS 2012 (technical and IP sessions) will be invited to re-submit to the IEEE Design and Test of Computers.
TTTC Test Technology Educational Program (TTEP) tutorials on emerging test technology topics will be offered during VTS 2012. Tutorial proposals should be submitted according to TTEP 2012 submission deadlines (http://computer.org/tab/tttc/teg/ttep).
Title and abstract submission for scientific papers, IP tracks and special sessions: October 8th, 2011
Cecilia Metra – General Chair
Claude Thibeault – Program Chair
For more information, visit us on the web at: http:///www.tttc-vts.org
The VLSI Test Symposium (VTS 2012 ) is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC).
IEEE Computer Society- Test Technology Technical Council
1ST VICE CHAIR
ITC GENERAL CHAIR
EAST & AFRICA
PRESIDENT OF BOARD
TTTC 2ND VICE CHAIR
IEEE DESIGN & TEST EIC