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TTTC's
Electronic Broadcasting Service |
4th IEEE International Workshop on Impact of Low-Power design on Test and Reliability |
CALL
FOR PARTICIPATION |
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The IEEE InternationalWorkshop on Impact of Low Power Design on Test and Reliability (LPonTR) aims to bring together design, reliability and test engineers and researchers to discuss the impact of advanced low-power low-voltage design methodologies of nanometer silicon systems on test and reliability. Power and thermal issues, leakage, process variations, susceptibility to environmental and operation-induced interference drive the development of low-power, process-tolerant design techniques and generate a new set of test and reliability challenges, questing for an innovative set of methodologies and tools. |
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Workshop Registration | |
Please refer to the ETS web site at:
http://www.iet.ntnu.no/workshop/ets2011/ |
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Advance Program | |
The technical program of the workshop can be downloaded at: http://www.iet.ntnu.no/workshop/ets2011/LPonTR.shtml |
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Additional Information | |
Dr. Alex Bystrov Dr. Patrick Girard |
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Committees | |
Chair / Co-Chair Special Session Chairs Programme Committee |
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For
more information, visit us on the web at: http://www.staff.ncl.ac.uk/a.bystrov/LPonTR/ |
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The 4th IEEE International Workshop on Impact of Low-Power design on Test and Reliability (LPonTR 2011) is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC). |
IEEE
Computer Society- Test Technology Technical Council |
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