TTEP 2011-B - Call for Tutorial Proposals

SUBMISSION DEADLINE APRIL 22, 2011!

CALL FOR TUTORIAL PROPOSALS

Overview -- Submissions -- Key Dates -- Additional Information -- Committees

Overview

The Tutorials & Education Group (TEG) of the IEEE Computer Society Test Technology Technical Council (TTTC) organizes in 2011 a comprehensive set of Test Technology Tutorials to be held in conjunction with TTTC sponsored technical meetings. The objective of this common call is to invite submissions for tutorial proposals in order to enable selecting the best fitted tutorials for each technical meeting, as part of the annual Test Technology Educational Program (TTEP).

The tutorials accepted by the Program Committee will be included in the Test Technology Educational Program, the intent of which is to serve the test and design professionals offering fundamental education and expert knowledge in state-of-the-art test technology topics.

Participation in TTEP-organized tutorials is accredited by IEEE Computer Society. Each full day tutorial corresponds to four TTEP units (half day tutorial corresponds to two TTEP units). Upon completion of every sixteen units official accreditation in the form of the “IEEE TTTC Test Technology Certificate” is presented to the participants.

The TTEP 2011B tutorials program includes the following technical meetings:

International Test Conference (ITC’11), September 18–23, Anaheim, California, USA
Asian Test Symposium (ATS’11), November 21–23, New Delhi, India

TTEP accommodates a wide range of technical areas, from mature test topics of high interest to industrial test engineers to emerging test topics with emphasis on novelty. TTEP is soliciting new and updated tutorial proposals and the topics of interest for year 2011-B TTEP Tutorials include (but are not limited to):

Automatic test equipment
Board-level testing
Built-In Self-Test
Defect oriented testing
Design for testability
DFT testers
Diagnosis and debug
Embedded core testing

High-speed interface testing
Interconnect characterization
Memory testing
Mixed-Signal/Analog testing
Nanometer technology testing
On-line and field testing
Performance/Delay testing
Power issues in testing

System-level testing
Test economics
Test synthesis
Test resource partitioning
Validation
Verification
Wafer testing
Yield optimization and test

Submissions

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All tutorial proposal submissions to TTEP 2011-B are to be made electronically (in PDF format using the TTEP tutorial proposal template provided on both the TTEP main web site and the submission website) through the TTEP submissions website:

http://www.molesystems.com/welcome/tttc/TTEP/2011-B/loginttep.php

Key Dates

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Submission deadline for TTEP11-B: April 22, 2011
Notification of acceptance for ITC 2011: June 10, 2011
Notification of acceptance for ATS 2011: September 2, 2011

Additional Information

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Dimitris Gizopoulos
TTEP Chair
University of Piraeus, Greece
T: +30 210 414 2372
F: +30 210 414 2264
E: dgizop@unipi.gr

Anand Raghunathan
TTEP Vice Chair (Organization)
Purdue University, USA
T: +1 765 494 3470
F: +1 765 494 3358
E: raghunathan@purdue.edu

Yiorgos Makris
TTEP Vice Chair (Program)
Yale University, USA
T: +1 203-432-1203
F: +1 203-432-7481
E: yiorgos.makris@yale.edu

Tutorials and Education Group

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Tutorials and Education Group Chair
Dimitris Gizopoulos
University of Piraeus

Vice Chair (Organization)
Anand Raghunathan
Purdue University

Vice Chair (Program)
Yiorgos Makris
Yale University

Finance
M. Nicolaidis, TIMA Laboratory

Publicity
C. Metra, University of Bologna

Planning
V. Agrawal, Auburn University
G. Robinson

Industry Relations
R. Aitken, ARM

New Topics
B. Courtois, CMP
M. Hsiao, Virginia Tech.

Audio/Visual
A. Jas, Intel

Electronic Media
S. Di Carlo, Poli. di Torino
G. Di Natale, LIRMM

Organizing Liaisons
M. Abadir, Freescale
U.Arz, PTB
V.Champac, INAOE
L.Fanucci, University of Pisa
M.Psarakis, University of Piraeus

Program Committee
M. Abadir, Freescale
T.Aikyo, STARC
R.Aitken, ARM
D.Appello, ST Microelectronics
U.Arz, PTB
S.Chakravarty, LSI Logic
V.Champac, INAOE
S.Davidson, Oracle
L.Fanucci, University of Pisa
A.Gattiker, IBM
P.Harrod, ARM
K.Hatayama, STARC
D.Josephson, Intel
T.M.Mak, Intel
H.Manhaeve, Q-Star
A.Osseiran, Edith Cowan University
A.Paschalis, University of Athens
M.Slamani, IBM
S.Sunter, Mentor Graphics

For more information, visit us on the web at: http://tab.computer.org/tttc/teg/ttep

The Test Technology Educational Program 2011-B (TTEP 2011) is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC).

TTTC's Electronic Broadcasting Service
	TTEP 2011-B TEST TECHNOLOGY EDUCATIONAL PROGRAM 2011-B http://tab.computer.org/tttc/teg/ttep