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IEEE International Symposium on
Defect and Fault Tolerance
CALL FOR PAPERS
DFT is an annual Symposium providing an open forum for presentations in the field of defect and fault tolerance in VLSI systems inclusive of emerging technologies. One of the unique features of this symposium is to combine new academic research with state-of-the-art industrial data, necessary ingredients for significant advances in this field. All aspects of design, manufacturing, test, reliability, and availability that are affected by defects during manufacturing and by faults during system operation are of interest.
The topics include (but are not limited to) the following ones:
Prospective authors should prepare an extended summary or the full paper (up to 9 pages in the IEEE 6X9 single column format), to be submitted as PDF file. Submission should be done electronically. Detailed information about the submission process will be made available on the symposium web page:
We are also interested in panel sessions that involve industrial experiences: please send an email to the Program co-Chairs with a brief description (1 page maximum) of the panel discussion
Paper Publication and Author Registration: Only original, unpublished work will be accepted, for regular or poster presentation at the symposium. Proceedings will be published by the IEEE Computer Society and will appear in the Digital Library.
Every accepted paper MUST have at least one full paid registration by the time the camera-ready paper is submitted for inclusion in the proceedings. The author is also expected to attend the Symposium and present the paper.
Best Student Paper Award: All papers with a student as both primary author and presenter will be taken into consideration for the 2011 Best Student Paper Award, sponsored by Intel.
Journal Special Issue: There is a possibility for inviting the authors of selected papers presented at DFT 2011 to submit an extended version of their work in a special issue of an archival journal.
Submission deadline: May 7, 2011
For more information, visit us on the web at: http://www.dfts.org
The IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT 2011) is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society, Technical Committee on Fault-Tolerant Computing, and Test Technology Technical Council (TTTC).
IEEE Computer Society- Test Technology Technical Council
1ST VICE CHAIR
ITC GENERAL CHAIR
EAST & AFRICA
PRESIDENT OF BOARD
TTTC 2ND VICE CHAIR
IEEE DESIGN & TEST EIC