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TTTC's
Electronic Broadcasting Service |
DATE 2011 Friday Workshop on March 18, 2011 http://www.date-conference.com/conference/date11-workshop-W5 |
CALL
FOR PAPERS |
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3D Integration is a promising technology for extending Moore’s momentum in the next decennium, offering heterogeneous technology integration, higher transistor density, faster interconnects, and potentially lower cost and time-to-market. But in order to produce 3D chips, new capabilities are needed: process technology, architectures, design methods and tools, and manufacturing test solutions. The goal of this Workshop is to bring together researchers, practitioners, and others interested in this exciting and rapidly evolving field, in order to update each other on the latest state-of-the-art, exchange ideas, and discuss future challenges. The prior edition of this workshop took place in conjunction with DATE 2009 and DATE 2010. The areas of interest include (but are not limited to) the following topics:
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Submissions are invited in the form of (extended) abstracts not exceeding two pages and must be sent in as PDF file to damien.riquet@st.com and Nikolaos.Minas@imec.be with “DATE11-3D-WS” as subject. All submissions will be evaluated for selection with respect to their suitability for the workshop, originality, and technical soundness. Selected submissions can be accepted for regular or poster presentation. At the workshop, an Electronic Workshop Digest will be made available to all workshop participants, which will include all material that authors are willing to provide: abstract, paper, slides, poster, etc. | ||||
Submission deadline: November 15, 2010 |
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Additional Information | ||||
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For
more information, visit us on the web at: http://www.date-conference.com/conference/date11-workshop-W5 |
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The DATE 2011 Friday Workshop on 3D Integration - Applications, Technology, Architecture, Design, Automation, and Test - is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC). |
IEEE
Computer Society- Test Technology Technical Council |
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