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IEEE Defect and Data-Driven Testing
Advance Registration Deadline October 1st, 2010!
CALL FOR PARTICIPATION
As technology scales, various new types of defects are presenting unique challenges to the test community. New test defect and data based methodologies are required to detect, monitor, and comprehend the various defect mechanisms at sub-50nm technology nodes and their impact on product quality and in-field reliability. Defect and data-driven testing (D3T) has been in practice for a number of years and often used for yield learning and analysis. It is now gaining attention more than ever in production test. D3T uses data to reduce defect levels, increase reliability, and to diagnose and solve yield problems. D3T can provide the basis for Adaptive Test decisions on which test conditions, tests, or test subsets to add/remove. It can be utilized for improving the overall quality of test by the use of outlier analysis. However, how to implement and analyze test and defect data in making these decisions is not a widely understood or utilized process in the industry. Closing the gap on knowledge of the process, new test techniques, and how defect models are being used to adapt test flows will be the goals of this year’s D3T workshop.
Paper presentations on topics related to the topics listed below are expected to generate active discussion on the challenges that must be met to ensure high IC quality through the end of the decade.
|Advance Registration Deadline: October 1st, 2010!|
|The ITC conference and all associated Test Week events will be held at the Austin Convention Center, Austin, Texas. Austin is the capital of the state of Texas, and its 1888 capitol building is an interesting landmark. Also of interest are the main campus of The University of Texas and the Lyndon B. Johnson Library and Museum. Close to the convention center is the lively East Sixth Street entertainment district which features many restaurants and a variety of music in the ―Live Music Capital of the World‖. The downtown area has miles of waterfront trails suitable for walking and jogging and is also home to the largest urban bat population in the US whose spectacular flight can be observed just before sunset. For more information about Austin, visit http://www.austintexas.org. Lodging for Test Week is in several hotels in the vicinity of the convention center.|
Vice Program Chair
Sankaran Menon, Intel
Rob Aitken, ARM
For more information, visit us on the web at: http://d3t.tttc-events.org/
The IEEE Defect and Data-Driven Testing (D3T 2010) is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC).
IEEE Computer Society- Test Technology Technical Council
1ST VICE CHAIR
ITC GENERAL CHAIR
EAST & AFRICA
PRESIDENT OF BOARD
TTTC 2ND VICE CHAIR
IEEE DESIGN & TEST EIC
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