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IEEE VLSI TEST SYMPOSIUM (VTS 2010)
CALL FOR PARTICIPATION
The IEEE VLSI Test Symposium explores emerging trends and novel concepts in the testing of integrated circuits and systems. The symposium is a leading international forum where many of the world's leading test experts and professionals from both industry and academia join to present and debate key issues in testing. VTS 2010 addresses key trends and challenges in the semiconductor design and manufacturing industries through an exciting program that includes Keynote and Plenary Talks, Technical Paper Sessions, Panels, New Topic Sessions, Full-day Tutorials, co-located Workshops, and the Innovative Practices Track.
TECHNICAL PAPER SESSIONS will present the latest research results in test, including:
INNOVATIVE PRACTICES (IP) TRACK highlights:
HOT TOPIC SESSIONS
VTS provides an opportunity for informal technical discussions among participants. This year, the social program will feature a visit to a local attraction (transportation provided) and a banquet sunset dinner on the beach. Attendees will also receive complementary breakfast, lunch and breaks each day of the conference. Santa Cruz, California provides a very attractive backdrop for all VTS 2010 activities. We are sure that you will find VTS 2010 enlightening, thought-provoking, rewarding, and enjoyable!
For a Preliminary Program, Conference Registration and Hotel Information please visit:
M. Abadir - Freescale
M. Renovell - LIRMM/CNRS
C. Thibeault - ETS
P. Maxwell - Aptina
C. Metra - U. Bologna
R. Galivanche - Intel Corp.
B. Courtois - TIMA
B. Kaminska - Simon Fraser U.
L. Anghel - TIMA
C.P. Ravikumar - Texas Instr
Innovative Practices Track
K. Hatayama - STARC
S. Mitra - Stanford U
D. Gizopoulos - UNIPI
S. Ozev - Arizona
Y. Makris - Yale University
S. Hellebrand - U Paderborn
C.H. Chiang - Alcatel-Lucent
Li Wang - Univ. of Calif. at Santa Barbara
B. Cory - Nvidia
J. Abraham - University of Texas at Austin
J. Figueras - U Pol Catalunya
For more information, visit us on the web at: http://www.tttc-vts.org
The 28th IEEE VLSI Test Symposium (VTS2010) is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC).
IEEE Computer Society- Test Technology Technical Council
1ST VICE CHAIR
ITC GENERAL CHAIR
EAST & AFRICA
PRESIDENT OF BOARD
TTTC 2ND VICE CHAIR
IEEE DESIGN & TEST EIC
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