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Since 2005, the TTTC Best Doctoral Thesis Award in test technology has been presented annually to the winner of a contest, which took place at the IEEE VLSI Test Symposium. The Award serves the purpose to promote most impactful doctoral student work, to provide the students with the exposure to the community and the prospective employers, and to support interaction between academia and industry in the field of test technology.In order to increase the worldwide participation of doctoral students, starting 2010, the contest will be expanded to a two-stage process. Semi-finals will be held at TTTC-sponsored conferences, symposia or workshops. The winners of the semi-finals, determined by jurys composed of industrial experts, will compete against each other in the finals, held at a major TTTC-sponsored conference or symposium. This major Award has recentlybeen named after Prof. Edward J. McCluskey, a key educator and mentor in the fields of test technology, logic design, and reliability.
In 2010, three semi-finals will be held. The first will be held at the IEEE VLSI Test Symposium (VTS’10), the second at the IEEE European Test Symposium (ETS’10), and the third at the IEEE Latin American Test Workshop (LATW’10). The finals will be held at the International Test Conference (ITC).
Doctoral students who have graduated in 2009 or 2010 or are expected to graduate in 2010 are invited to submit a one page abstract of their thesis, including the names of the student and the advisor and the start/end dates of the thesis. A second page is allowed for references and/or figures only. An individual can only participate in the contest once in a lifetime. Prospective participants are encouraged to participate when they are close to thesis completion and have obtained sufficient results. Submissions to multiple regional sites are prohibited. Submission links and deadlines are given above.
This award is organized by the TTTC Students Activities Committee.
For more information, please contact Ilia Polian at: TTTC Student Activities Group
2009 (held at IEEE VLSI Test Symposium)
First place winner: Mahmut Yilmaz, Duke University
Second place winner: Erkan Acar, Duke University
Third place winner: Bo Yang, Polytechnic Institute of NYU
2008 (held at IEEE VLSI Test Symposium)
First place winner: Devanathan Varadarajan, Indian Institute of Technology, Madras, India
Second place winner: Sudarshan Bahukudumbi, Duke University, USA
Third place winner: Francois-Fabien Ferhani, Stanford University, USA
2007 (held at IEEE VLSI Test Symposium)
First place winner: Nisar Ahmed, University of Connecticut, USA
Second place winner: Nikola Bombieri, University of Verona, Italy
Third place winner: Ahcene Bounceur, TIMA Laboratory, Grenoble, France
2006 (held at IEEE VLSI Test Symposium)
First place winner: Federico di Palma, University of Pavia, Italy
Second place winner: Achraf Dhayni, TIMA Laboratory, Grenoble, France
Third place winner: Paolo Bernardi, Politecnico di Torino, Italy
2005 (held at IEEE VLSI Test Symposium)
First place winner: Alberto Valdes-Garcia
Second place winner: Anand Gopalan
Third place co-winner: Swarup Bhunia
Third place co-winner: Haralampos Stratigopoulos
For more information, email Ilia Polian at: TTTC Student Activities Group
The Doctoral Thesis Award 2010 is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council Student Activities Group (TTTC).
IEEE Computer Society- Test Technology Technical Council
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ITC GENERAL CHAIR
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