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Asian Test Symposium (ATS'09)
CALL FOR PAPERS
The Asian Test Symposium (ATS) provides an open forum for researchers and industrial practitioners from all countries of the world, especially from Asia, to exchange innovative ideas on system, board, and device testing with design, manufacturing and field considerations in mind. The official language of the symposium is English.
Original contributions on testing are solicited. Topics of interest include, but are not limited to,
The ATS'09 Program Committee invites original, unpublished paper submissions on the above topics. Paper submissions should be complete manuscripts, not exceeding six pages (including figures, tables, and bibliography) in a standard IEEE two-column format. Authors should clearly explain the significance of the work, highlight novel features, and describe its current status. On the title page, please include: author name(s) and affiliation(s), and the mailing address, phone number, fax number, and e-mail address of the contact author. A 50-words abstract and five keywords are also required. All submissions are to be made electronically through the ATS’09 website.
Electronic submissions in PDF files are strongly recommended. Detailed instructions for submissions are to be found at the ATS’09 website.
The submission will be considered evidence that upon acceptance the author(s) will prepare the final manuscript (6 pages for regular session) in time for inclusion in the proceedings and will present the paper at the Symposium.
Submission deadline: May 11, 2009
Local Arrangement Chair
Industrial Arrangement Chair
North American Liaison
For more information, visit us on the web at: http://www.event URL.com
The 18th Asian Test Symposium (ATS'09) is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC) and the National Chung-Hsing University, Taiwan.
IEEE Computer Society- Test Technology Technical Council
1ST VICE CHAIR
ITC GENERAL CHAIR
EAST & AFRICA
PRESIDENT OF BOARD
TTTC 2ND VICE CHAIR
IEEE DESIGN & TEST EIC
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