TTTC's Electronic Broadcasting Service
Workshop on Design for Reliability and Variability
Held in Conjunction with ITC Test Week (ITC 2008)
CALL FOR PARTICIPATION
As silicon based CMOS technologies are fast approaching their ultimate limits, reliability is threatened by issues such as process, voltage and temperature variability, accelerated aging and wearout, radiation induced soft-errors and cross talk. In particular, variability of process, voltage and temperature represent a significant threat not only for parametric yield but also for reliability, since they induce timing faults that are extremely difficult to detect during manufacturing testing. It results on increasing ratio of circuits passing fabrication test that are susceptible to manifest failures in the field.
These problems are creating barriers to further technology scaling and are forcing the introduction of new process, design and test solutions aimed at maintaining acceptable levels of reliability.
As elimination of these issues is becoming increasingly difficult, various design techniques are emerging to circumvent them. These techniques may incur area, power, yield or performance penalties. Thus, to enable their adoption by the industry there is need for novel solutions to minimize penalties and provide automation tools.
|The Workshop will be held at the Santa Convention Center, 5001 Great America Parkway (corner of Tasman Drive), Santa Clara, California 95054 and the adjacent Hyatt Regency Santa Clara Hotel. Santa Clara is the center of Silicon Valley, an hour south of San Fancisco. The convention center is adjacent to the Santa Clara Golf and Tennis Club. Also nearby is the interactive Intel Museum. There are many restaurants at the Mercado Santa Clara entertainment and food complex, Rivermark Plaza and Santana Row. For more information about Santa Clara, visit http://santaclara.org.|
Vice General Chair
Vice Program Chair
Jacob Abraham, Univ. of Texas
For more information, visit us on the web at: http://obaldia.imag.fr/drvw/
The 1st IEEE Workshop on Design for Reliability and Variability (DRV2008 ) is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC) and the IEEE Computer Society Design Automation Technical Committee.
IEEE Computer Society- Test Technology Technical Council
1ST VICE CHAIR
ITC GENERAL CHAIR
EAST & AFRICA
PRESIDENT OF BOARD
TTTC 2ND VICE CHAIR
IEEE DESIGN & TEST EIC
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