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26th IEEE VLSI TEST SYMPOSIUM (VTS 2008)
April 27th - May 1st, 2008
Rancho Bernardo Inn, San Diego, California, USA

http://www.tttc-vts.org

CALL FOR PARTICIPATION


LAST CHANCE TO TAKE ADVANTAGE OF DISCOUNTED VTS 2008 ROOM RATES

Room Rates At the
Rancho Bernardo Inn Will Increase After APRIL 4, 2008

ONLINE REGISTRATION IS NOW AVAILABLE AT: https://www.cemamerica.com/vts2008/
Advance Registration Rates End April 4, 2008

Program Highlights -- More Information -- Committees

Program Highlights

The IEEE VLSI Test Symposium explores emerging trends and novel concepts in the testing of integrated circuits and systems. The symposium is a leading international forum where many of the world's leading test experts and professionals from both industry and academia join to present and debate key issues in testing. VTS 2008 addresses key trends and challenges in the semiconductor design and manufacturing industries through an exciting program that includes Keynote and Plenary Talks, Technical Paper Sessions, Embedded Tutorials, Panels, Hot Topic Sessions, Full-day Tutorials, co-located Workshops, and the Innovative Practices Track.

TECHNICAL PAPER SESSIONS will present the latest research results in test, including:

  • Testing for High Speed Communication Systems
  • Compaction for Testing
  • ATE Data Volume
  • Test & Diagnosis of Scan Chains
  • Memory Diagnosis and Repair
  • Testing for Nanometer CMOS
  • Low Power Scan Testing
  • Testing of Analog Circuits
  • ATPG Techniques
  • Testing of RF Circuits
  • Transition Faults
  • Delay Test and Measurement
  • Testing and Error Tolerance for Emergent Technology Circuits
  • Testing of Mixed Signal Circuits
  • Debug and Diagnosis
  • Fault Tolerance

INNOVATIVE PRACTICES (IP) TRACK highlights cutting-edge challenges faced by test practitioners, and innovative solutions employed to address them.

  • Highways to Zero-defects
  • Device Degradation and Infant Mortality
  • Automatic Test Development for Mixed-Signal/RF Circuits
  • Pre-Silicon Verification & Post-Silicon Validation and Debug
  • Design for Yield and Manufacturability
  • STIL Utilization in Practice
  • Testing for Complex Failures and Process Variations of Memories
  • New Emerging Practices for Semiconductor Test
  • Fault Localization Practices and Challenges

SPECIAL SESSIONS will include:

  • EMBEDDED TUTORIALS: Robust Design, Nanoelectronics, Measuring IC Timing Parameters
  • HOT TOPICS: Yield Management and DPPM Reduction, Biomedical Devices - New Test Challenges
  • NEW TOPIC: Quantum Computing
  • PANELS: Mitigating Reliability, Yield and Power Issues in Nano-CMOS: Design Problem or EDA Problem?;  Is Ubiquitous RF at Odds with Test?; APPRENTICE: VTS Edition
  • TTTC 2008 Best Doctoral Thesis Contest

FULL-DAY TUTORIALS and WORKSHOPS complement the core technical program of VTS.

WORKSHOPS
IEEE Workshop on Test of Wireless Circuits and Systems (WTW)
IEEE International Workshop on Silicon Debug and Diagnosis (SDD)

TEST TECHNOLOGY EDUCATIONAL PROGRAM (TTEP) TUTORIALS
Soft Errors: Technology Trends, System Effects, Protection Techniques and Case Studies
Practices in Analog, Mixed-signal and RF Testing
Statistical Screening Methods Targeting "Zero Defect" IC Quality and Reliability

The social program at VTS provides an opportunity for informal technical discussions among participants. San Diego, California, provides a very attractive backdrop for all VTS 2008 activities. We are sure that you will find VTS 2008 enlightening, thought-provoking, rewarding, and enjoyable!

More Information

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For more information contact:

GENERAL CHAIR
Alex Orailoglu
University of California, San Diego
La Jolla, CA 92093-0404, USA
T: +1-858-534-0914
E: alex@cs.ucsd.edu

PROGRAM CO-CHAIRS
Peter Maxwell

Micron Technology
San Jose, CA, USA
T: +1-408-660-2420
E: pmaxwell@micron.com

Cecilia Metra
ARCES - University of Bologna
Bologna, Italy
T: + 39 051 209 3038
E: cmetra@deis.unibo.it

Committees

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General Chair
A. Orailoglu - UC San Diego

Program Chair
P. Maxwell - Micron
C. Metra - U Bologna

Past Chair
P. Prinetto - Politecnico di Torino

Vice-General Co-Chairs
S. M. Reddy - U Iowa
H.-J. Wunderlich - U Stuttgart

Vice-Program Chair
M. Renovell - LIRMM

New Topics
B. Courtois - TIMA

Special Sessions
L. Anghel - TIMA
C.P. Ravikumar - Texas Instr

Innovative Practices Track
K. Hatayama - STARC
S. Mitra - Stanford U

Registration
C. Thibeault - E Tech Sup Montreal

Publicity Chair
C.H. Chiang - Alcatel-Lucent

Publicity Members
Ismet Bayraktaroglu - Sun Microsystems
Stefano Di Carlo - Politecnico di Torino
Giorgio Di Natale - LIRMM

Publications
S. Ravi - Texas Instr

Audio/Visual
S. Hellebrand - U Paderborn

Finance
M. Abadir - Freescale

Local Arrangements

I. Harris - UC Irvine

Latin America Liaison
L. Carro - UFRGS

North America Liaison
R. Kapur - Synopsys

Middle East & Africa Liaison
R. Makki - UAE U

Asia & Pacific Liaison
Y. Sato - Hitachi

Eastern Europe Liaison

R. Ubar - Tallin U

Western Europe Liaison
Z. Peng - Linkoping U

Ex-Officio
Y. Zorian - Virage Logic

Program Committee

Methods
J. A. Abraham - UT Austin
V. D. Agrawal - Auburn U
B. Becker - U Freiburg
B. Cory - NVIDIA
P. Girard - LIRMM
D. Gizopoulos - U Piraeus
S. Gupta - USC
I. Hartanto - Xilinx
B. Kaminska - Pultronics
H. Konuk - Broadcom
C. Landrault - LIRMM
X. Li - Chinese Academy of Sciences
F. Lombardi - Northeastern U
E.J. Marinissen - NXP
E.J. McCluskey - Stanford U
L. Milor - Georgia Tech
S. Mourad - Santa Clara U
Z. Navabi - Worcester Polytechnic
S. Ozev - Duke U
A. Raghunathan - NEC
J. Rajski - Mentor Graphics
J. Segura - U Illes Balears
S. Shoukourian - Virage Logic
M. Soma - U Washington
S. Sunter - LogicVision
J. Tyszer - Poznan U

Applications
D. Appello - STMicroelectronics
K. Arabi - PMC Sierra
C.J. Clark - Intellitech
R. Galivanche - Intel
A. Khoche - Verigy
Y. Makris - Yale U
P. Muhmenthaler - Infineon
J. Plusquellic - UMBC
C.W. Wu - Nat Tsing Hua U

 

For more information, visit us on the web at: http://www.tttc-vts.org

The 26th IEEE VLSI TEST SYMPOSIUM (VTS 2008) is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC).


IEEE Computer Society- Test Technology Technical Council

TTTC CHAIR
Adit D. SINGH
Auburn University - USA
Tel. +1-334-844-1847
E-mail adsingh@eng.auburn.edu

SENIOR PAST CHAIR
Yervant ZORIAN
Virage Logic - USA
Tel. +1-510-360-8035
E-mail yervant.zorian@viragelogic.com

TTTC 2ND VICE CHAIR
Chen-Huan CHIANG

Alcatel-Lucent - USA
Tel. +1-973-386-6759
E-mail chenhuan@alcatle-lucent.com

FINANCE
Adit D. SINGH
Auburn University - USA
Tel. +1-334-844-1847
E-mail adsingh@eng.auburn.edu

DESIGN & TEST MAGAZINE
Tim CHENG
University of California, Santa Barbara - USA
Tel. +1-805-893-72942
E-mail timcheng@ece.ucsb.edu

TECHNICAL MEETINGS
Chen-Huan CHIANG
Alcatel-Lucent - USA
Tel. +1-973-386-6759
E-mail chenhuan@alcatle-lucent.com

TECHNICAL ACTIVITIES
Victor Hugo CHAMPAC
Instituto Nacional de Astrofisica - Mexico
Tel.+52-22-470-517
E-mail champac@inaoep.mx

ASIA & SOUTH PACIFIC
Hideo FUJIWARA
Nara Institute of Science and Technology - Japan
Tel. +81-74-372-5220
E-mail fujiwara@is.aist-nara.ac.jp

LATIN AMERICA
Marcelo LUBASZEWSKI
Federal University of Rio Grande do Sul - Brazil
Tel. +34-93-401-6603
E-mail luba@vortex.ufrgs.br

NORTH AMERICA
William R. MANN
Tel. +1-949-645-3294
E-mail william.mann@ieee.org

COMMUNICATIONS
Adit D. SINGH
Auburn University - USA
Tel. +1-334-844-1847
E-mail adsingh@eng.auburn.edu

INDUSTRY ADVISORY BOARD
Yervant ZORIAN
Virage Logic - USA
Tel. +1-510-360-8035
E-mail yervant.zorian@viragelogic.com

 

PAST CHAIR
André IVANOV
University of British Columbia - Canada
Tel. +1-604-822-6936
E-mail ivanov@ece.ubc.ca

TTTC 1ST VICE CHAIR
Michael NICOLAIDIS
TIMA Laboratory - France
Tel. +33-4-765-74696
E-mail michael.nicolaidis@imag.fr

SECRETARY
Christian LANDRAULT
LIRMM - France
Tel. +33-4-674-18524
E-mail landrault@lirmm.fr

INTERNATIONAL TEST CONFERENCE
Jill E. SIBERT
Raspberry Comm.
- USA
Tel. +1-484-894-1111
E-mail jill_sibert@raspberrycom.com

TEST WEEK COORDINATION
Yervant ZORIAN
Virage Logic - USA
Tel. +1-510-360-8035
E-mail yervant.zorian@viragelogic.com

TUTORIALS AND EDUCATION
Dimitris GIZOPOULOS

University of Piraeus
- Greece
Tel. +30-210-414-2372
E-mail dgizop@unipi.gr

STANDARDS
Rohit KAPUR

Synopsys
- USA
Tel. +1-650-934-1487
E-mail rkapur@synopsys.com

EUROPE
Zebo PENG
Linköping University - Sweden
Tel. +46-13-282-067/-281-000
E-mail zpe@ida.liu.se

MIDDLE EAST & AFRICA
Ibrahim HAJJ
American University of Beirut - Lebanon
Tel. +961-1-341-952
E-mail ihajj@aub.edu.lb

STANDING COMMITTEES
Michael NICOLAIDIS
TIMA Laboratory - France
Tel. +33-4-765-74696
E-mail michael.nicolaidis@imag.fr

ELECTRONIC MEDIA
Alfredo BENSO
Politecnico di Torino - Italy
Tel. +39-011-564-7080
E-mail alfredo.benso@polito.it


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