VTS 2008 - Call for Participation

CALL FOR PARTICIPATION

LAST CHANCE TO TAKE ADVANTAGE OF DISCOUNTED VTS 2008 ROOM RATES
Room Rates At the Rancho Bernardo Inn Will Increase After APRIL 4, 2008

ONLINE REGISTRATION IS NOW AVAILABLE AT: https://www.cemamerica.com/vts2008/
Advance Registration Rates End April 4, 2008

Program Highlights -- More Information -- Committees

Program Highlights

The IEEE VLSI Test Symposium explores emerging trends and novel concepts in the testing of integrated circuits and systems. The symposium is a leading international forum where many of the world's leading test experts and professionals from both industry and academia join to present and debate key issues in testing. VTS 2008 addresses key trends and challenges in the semiconductor design and manufacturing industries through an exciting program that includes Keynote and Plenary Talks, Technical Paper Sessions, Embedded Tutorials, Panels, Hot Topic Sessions, Full-day Tutorials, co-located Workshops, and the Innovative Practices Track.

TECHNICAL PAPER SESSIONS will present the latest research results in test, including:

Testing for High Speed Communication Systems
Compaction for Testing
ATE Data Volume
Test & Diagnosis of Scan Chains
Memory Diagnosis and Repair
Testing for Nanometer CMOS
Low Power Scan Testing
Testing of Analog Circuits
ATPG Techniques
Testing of RF Circuits
Transition Faults
Delay Test and Measurement
Testing and Error Tolerance for Emergent Technology Circuits
Testing of Mixed Signal Circuits
Debug and Diagnosis
Fault Tolerance

INNOVATIVE PRACTICES (IP) TRACK highlights cutting-edge challenges faced by test practitioners, and innovative solutions employed to address them.

Highways to Zero-defects
Device Degradation and Infant Mortality
Automatic Test Development for Mixed-Signal/RF Circuits
Pre-Silicon Verification & Post-Silicon Validation and Debug
Design for Yield and Manufacturability
STIL Utilization in Practice
Testing for Complex Failures and Process Variations of Memories
New Emerging Practices for Semiconductor Test
Fault Localization Practices and Challenges

SPECIAL SESSIONS will include:

EMBEDDED TUTORIALS: Robust Design, Nanoelectronics, Measuring IC Timing Parameters
HOT TOPICS: Yield Management and DPPM Reduction, Biomedical Devices - New Test Challenges
NEW TOPIC: Quantum Computing
PANELS: Mitigating Reliability, Yield and Power Issues in Nano-CMOS: Design Problem or EDA Problem?; Is Ubiquitous RF at Odds with Test?; APPRENTICE: VTS Edition
TTTC 2008 Best Doctoral Thesis Contest

FULL-DAY TUTORIALS and WORKSHOPS complement the core technical program of VTS.

WORKSHOPS
IEEE Workshop on Test of Wireless Circuits and Systems (WTW)
IEEE International Workshop on Silicon Debug and Diagnosis (SDD)

TEST TECHNOLOGY EDUCATIONAL PROGRAM (TTEP) TUTORIALS
Soft Errors: Technology Trends, System Effects, Protection Techniques and Case Studies
Practices in Analog, Mixed-signal and RF Testing
Statistical Screening Methods Targeting "Zero Defect" IC Quality and Reliability

The social program at VTS provides an opportunity for informal technical discussions among participants. San Diego, California, provides a very attractive backdrop for all VTS 2008 activities. We are sure that you will find VTS 2008 enlightening, thought-provoking, rewarding, and enjoyable!

More Information

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For more information contact:

GENERAL CHAIR
Alex Orailoglu
University of California, San Diego
La Jolla, CA 92093-0404, USA
T: +1-858-534-0914
E: alex@cs.ucsd.edu

PROGRAM CO-CHAIRS
Peter Maxwell
Micron Technology
San Jose, CA, USA
T: +1-408-660-2420
E: pmaxwell@micron.com

Cecilia Metra
ARCES - University of Bologna
Bologna, Italy
T: + 39 051 209 3038
E: cmetra@deis.unibo.it

Committees

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General Chair
A. Orailoglu - UC San Diego

Program Chair
P. Maxwell - Micron
C. Metra - U Bologna

Past Chair
P. Prinetto - Politecnico di Torino

Vice-General Co-Chairs
S. M. Reddy - U Iowa
H.-J. Wunderlich - U Stuttgart

Vice-Program Chair
M. Renovell - LIRMM

New Topics
B. Courtois - TIMA

Special Sessions
L. Anghel - TIMA
C.P. Ravikumar - Texas Instr

Innovative Practices Track
K. Hatayama - STARC
S. Mitra - Stanford U

Registration
C. Thibeault - E Tech Sup Montreal

Publicity Chair
C.H. Chiang - Alcatel-Lucent

Publicity Members
Ismet Bayraktaroglu - Sun Microsystems
Stefano Di Carlo - Politecnico di Torino
Giorgio Di Natale - LIRMM

Publications
S. Ravi - Texas Instr

Audio/Visual
S. Hellebrand - U Paderborn

Finance
M. Abadir - Freescale

Local Arrangements
I. Harris - UC Irvine

Latin America Liaison
L. Carro - UFRGS

North America Liaison
R. Kapur - Synopsys

Middle East & Africa Liaison
R. Makki - UAE U

Asia & Pacific Liaison
Y. Sato - Hitachi

Eastern Europe Liaison
R. Ubar - Tallin U

Western Europe Liaison
Z. Peng - Linkoping U

Ex-Officio
Y. Zorian - Virage Logic

Program Committee

Methods
J. A. Abraham - UT Austin
V. D. Agrawal - Auburn U
B. Becker - U Freiburg
B. Cory - NVIDIA
P. Girard - LIRMM
D. Gizopoulos - U Piraeus
S. Gupta - USC
I. Hartanto - Xilinx
B. Kaminska - Pultronics
H. Konuk - Broadcom
C. Landrault - LIRMM
X. Li - Chinese Academy of Sciences
F. Lombardi - Northeastern U
E.J. Marinissen - NXP
E.J. McCluskey - Stanford U
L. Milor - Georgia Tech
S. Mourad - Santa Clara U
Z. Navabi - Worcester Polytechnic
S. Ozev - Duke U
A. Raghunathan - NEC
J. Rajski - Mentor Graphics
J. Segura - U Illes Balears
S. Shoukourian - Virage Logic
M. Soma - U Washington
S. Sunter - LogicVision
J. Tyszer - Poznan U

Applications
D. Appello - STMicroelectronics
K. Arabi - PMC Sierra
C.J. Clark - Intellitech
R. Galivanche - Intel
A. Khoche - Verigy
Y. Makris - Yale U
P. Muhmenthaler - Infineon
J. Plusquellic - UMBC
C.W. Wu - Nat Tsing Hua U

For more information, visit us on the web at: http://www.tttc-vts.org

The 26th IEEE VLSI TEST SYMPOSIUM (VTS 2008) is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC).

TTTC's Electronic Broadcasting Service
	26th IEEE VLSI TEST SYMPOSIUM (VTS 2008) April 27th - May 1st, 2008 Rancho Bernardo Inn, San Diego, California, USA http://www.tttc-vts.org