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Design & Test of Computers
Special Issue on IEEE Std 1500 and Its Usage
CALL FOR PAPERS
The increased use of embedded predesigned reusable cores necessitates a core-based test strategy, in which cores are tested as separate entities. IEEE Std 1500-2005 (Standard Testability Method for Embedded Core-Based Integrated Circuits) aims at improving ease of reuse and facilitating interoperability with respect to the test of core-based system chips, especially if they contain cores from different sources. Developed over a period of eight years by a multidisciplinary team in which the various industry segments were involved, the standard was approved in August 2005. It is time now to look back at usage experiences of the standard, and forecast future challenges on the road of modular (core-based) SoC testing.
IEEE Design & Test seeks original manuscripts for a special issue on IEEE Std 1500 and Its Usage, scheduled for publication in November/December 2008. The objective of this special issue is to share ways of using, and experiences with, IEEE Std 1500, as well as new research topics emerging in this domain. Topics of interest include:
|Submission and Review Procedures|
Prospective authors should follow the submission guidelines for IEEE Design & Test. All manuscripts must be submitted electronically to the IEEE Manuscript Central Web site at https://mc.manuscriptcentral.com/cs-ieee. Indicate that you are submitting your article to the special issue on “IEEE Std 1500 and Its Usage.” All articles will undergo the standard IEEE Design & Test review process. Submitted manuscripts must not have been previously published or currently submitted for publication elsewhere. Manuscripts must not exceed 5,000 words, including figures (with each average-size figure counting as 150 words) and including a maximum of 12 references (50 for surveys); this amounts to about 4,200 words of text and five figures. Accepted articles will be edited for clarity, structure, conciseness, grammar, passive to active voice, logical organization, readability, and adherence to style. Please see IEEE D&T Author Resources at http://www.computer.org/dt/author.htm, then scroll down and click on Author Center for submission guidelines and requirements.
Please direct questions regarding this special issue to Guest Editors.
A copy of this Call for Papers is available at http://www.computer.org/portal/pages/design/content/1108cfp.html, which can also be accessed from
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