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IEEE VLSI TEST SYMPOSIUM (VTS 2008)
CALL FOR PAPERS
The IEEE VLSI Test Symposium (VTS) explores emerging trends and novel concepts in testing, and verification / validation of microelectronic circuits and systems. Major topics include, but are not limited to:
The VTS 2008 website is open for submissions:
The VTS Program Committee invites original, unpublished paper submissions for VTS 2008. Paper submissions should be complete manuscripts, up to eight pages (inclusive of figures, tables, and bibliography) in a standard IEEE two-column format; papers exceeding the page limit will be returned without review. Authors should clearly explain the significance of the work, highlight novel features, and describe its current status. On the title page, please include: author name(s) and affiliation(s), and the mailing address, phone number, fax number, and e-mail address of the contact author. A 50-word abstract and five keywords identifying the topic area are also required.
Proposals for the Innovative Practices track, and Special Sessions are also invited. The innovative practices track will highlight cutting-edge challenges faced by test practitioners, and innovative solutions employed to address them. Special sessions can include panels, embedded tutorials, or hot topic presentations. Innovative practices track and special session proposals should include a title, name and contact information of the session organizer(s), a 150-to-200 word abstract, and a list of prospective participants.
All submissions are to be made electronically through the VTS website. The deadline for regular paper submission is November 5, 2007 . Detailed instructions for submissions are to be found at the conference website http://www.tttc-vts.org. Authors will be notified of the disposition of their papers by 21st December 2007. A submission will be considered as evidence that, upon acceptance, the author(s) will present the paper at the symposium, and will submit a final camera-ready version of the paper for inclusion in the proceedings. In the case of innovative practice and special sessions, the organizers commit to submit a session title, abstract, and list of participants for inclusion in the symposium proceedings and program.
VTS 2008 will present a Best Paper Award, a Best Panel Award, and a Best IP Track Session Award based on the evaluations of reviewers, attendees, and an invited panel of judges.
TTTC Test Technology Educational Program (TTEP) tutorials on emerging test technology topics will be offered during VTS 2008. Tutorial proposals should be submitted according to TTEP 2008 submission deadlines (http://tab.computer.org/tttc/teg/ttep).
VTS08 Call-for-Paper is at: http://www.tttc-vts.org/public_html/new/2008/cfp.pdf
VTS08 Submission Deadlines:
All submissions are to be made electronically through the VTS website.
For general information:
Innovative Practices Track
Latin America Liaison
North America Liaison
Asia & Pacific Liaison
Eastern Europe Liaison
Western Europe Liaison
Program Committee (to include):
For more information, visit us on the web at: http://www.tttc-vts.org
The 26th IEEE VLSI TEST SYMPOSIUM (VTS 2008) is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC).
IEEE Computer Society- Test Technology Technical Council
TTTC 2ND VICE CHAIR
DESIGN & TEST MAGAZINE
& SOUTH PACIFIC
1ST VICE CHAIR
EAST & AFRICA
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