TTTC's Electronic Broadcasting Service
2nd IEEE International Design and Test Workshop (IDT'07)
CALL FOR PAPERS
This event provides a unique forum to discuss novel approaches in design, automation and test in the Middle East and Africa (MEA) region for researchers and practitioners in the areas of VLSI design, test and fault tolerance to come together to discuss new research ideas and present new research results. This event will provide the only VLSI Design & Test-specific meeting in the MEA region. Workshop topics include all aspect of design, test and automation. Specific topics are to include:
To present their work at the workshop, authors are invited to submit a full paper or extended summary of at least three pages of recent research or best current practices. Each submission should include: title, full name and affiliation of all authors, an abstract of 50 words, and keywords. It should also identify a contact author and include a complete correspondence address, phone number, fax number, and E-mail address. All submissions must be made electronically in PDF or Postscript format through the IDT website. Proposals for panels, hot topic sessions and embedded tutorials are also invited.
Please ensure that your PDF or Postscript file is readable by Acrobat Reader or Ghostview. The submission of a paper, a hot topic session or a panel proposal will be considered evidence that upon acceptance, the author(s) will present the paper or organize the panel at the workshop.
Submission Deadline: October 15th, 2007
Authors of accepted papers will be invited to submit their final manuscript, providing the name and contact
For general information:
Local Arrangements Chair
North American Liaison
Program Committee (to include):
For more information, visit us on the web at: http://www.tttc-idt.org
The Second IEEE International Design and Test Workshop (IDT'07) is co-sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC) and technically co-sponsored by the IEEE Circuits & Systems Society.
IEEE Computer Society- Test Technology Technical Council
TTTC 2ND VICE CHAIR
DESIGN & TEST MAGAZINE
& SOUTH PACIFIC
1ST VICE CHAIR
EAST & AFRICA
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