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TTTC Test Technology Educational Program
(TTEP) 2007

Tutorials at ITC Test Week 2007

http://tab.computer.org/tttc/teg/ttep/

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Overview -- TTEP Tutorials at ITC 2007 -- TTTC Tutorials and Education Group

Overview

The Tutorials & Education Group of the IEEE Computer Society Test Technology Technical Council (TTTC) presents a comprehensive set of sixteen full-day tutorials on topics of current interest to test professionals and researchers at ITC Test Week 2007 in Santa Clara, California. All tutorials qualify for credit towards IEEE TTTC certification under the TTEP program. Eight tutorials will be held on Sunday, October 21st, and eight on Monday, October 22nd. The titles of tutorials are listed below.

For more details and registration information on the 2007 ITC/TTEP tutorials see the ITC Test Week 2007 Advance Program and Registration on www.itctestweek.org.

Advance registration deadline is September 24. Admission for on-site registrants is subject to availability. For further information regarding TTEP annual tutorials program, please visit:

http://tab.computer.org/tttc/teg/ttep/

TTEP Tutorials at ITC 2007
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TUTORIALS 1 to 8
Sunday, Oct. 21, 8:30 a.m. - 4:30 p.m.


TUTORIAL 1

NEW
DFX: The Convergence of Yield, Manufacturing, and Test
Presenters: R. Aitken

TUTORIAL 2

NEW
Delay Testing: Theory and Practice
Presenter: N. Tendolkar, S. Patil

TUTORIAL 3

UPDATED

Statistical Screening Methods Targeting “Zero Defect” IC Quality and Reliability
Presenter: A. Singh


TUTORIAL 4

UPDATED
Dealing with Timing Issues for Sub-100n Designs >From Modeling to Mass Production
Presenters: Li-C. Wang, M. Abadir
 
TUTORIAL 5
 
UPDATED
Practices in Analog, Mixed-signal, and RF Testing
Presenter: S. Abdennadher, S. Shaikh
 
TUTORIAL 6
 
UPDATED
Test Strategies for System-in-Package
Presenters: Y. Zorian
 
TUTORIAL 7
 
UPDATED
Memory Test Challenges — A Practical and Implementation View of BIST and Other DFT Techniques
Presenters: V. Jayaram, S. Lai 
 

TUTORIAL 8  
 
UPDATED
Digital Timing Measurements From Scopes and Probes to Timing and Jitter
Presenters: W. Maichen
 
 

TUTORIALS 9 to 16
Monday, Oct. 22, 8:30 a.m. - 4:30 p.m.


TUTORIAL 9

NEW
IEEE 1500 Building a Compliant Wrapper
Presenters: T.McLaurin, F.Da Silva, T.Waayers

TUTORIAL 10

NEW
Delay Test: A Practical Approach
Presenters: A. Cron, B. Kruseman

TUTORIAL 11

UPDATED
Advanced Memory Testing
Presenter: A. van de Goor

TUTORIAL 12

NEW
Scan Compression Techniques: Theory and Practice
Presenters: R. Parekhji, T. Williams, R. Kapur, J. Abraham

TUTORIAL 13

UPDATED
Wafer Probe Test Technology
Presenter: W. Mann, J. Broz

TUTORIAL 14

UPDATED
Design for Manufacturability
Presenters: Y. Zorian, J.A. Carballo

TUTORIAL 15

UPDATED
Understanding Failure Mechanisms and Test Methods in Nanometer Technologies
Presenter: J. Segura, C. Hawkins

TUTORIAL 16

UPDATED
Design for Testability for RF Circuits and Systems
Presenters: M. Margala, S. Osev
TTTC Tutorials and Education Group
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Chair
Dimitris Gizopoulos
University of Piraeus

Vice Chair (Organization)
Anand Raghunathan
NEC Labs

Vice Chair (Program)
Kaushik Roy
Purdue University

Planning
V. Agrawal, Auburn University
G. Robinson

Communications
M. Hsiao, Virginia Tech.

Industry Relations
R. Aitken, ARM

Finance
M. Nicolaidis, TIMA Laboratory

Initiatives – New Topics
B. Courtois, TIMA

Publicity
Y. Makris, Yale University
C. Metra, University of Bologna

Audio/Visual
S. Menon, Intel

Electronic Media
G. Xenoulis, U. of Piraeus

Organizing Liaisons
U. Arz, PTB
V. Champac, INAOE
I. Ghosh, Fujitsu
H. Li, Chinese Acad. of Sciences
Z. Peng, Linkoping U.
M. Psarakis, Piraeus U.
J. Segura, U. Illes Balears

Program Committee
V.D.Agrawal, Auburn U.
T.Aikyo, STARC
R.Aitken, ARM
D.Appello, ST Microelectronics
U.Arz, PTB
S.Bhunia, Case West. U.
K.Butler, Texas Instruments
S.Chakravarty, Cswitch
V.Champac, INAOE
S.Davidson, Sun
J.Figueras, UPC Barcelona
A.Gattiker, IBM
P.Harrod, ARM
K.Hatayama, STARC
D.Josephson, Intel
H. Li, Chinese Acad. of Sciences
H.Manhaeve, Q-Star
A.Paschalis, U. of Athens
Z.Peng, Linkoping U.
A.Raghunathan, NEC Labs
R.Raina, Freescale
J.Rajski, Mentor Graphics
G.Roberts, McGill U.
M.Slamani, IBM
B.West, Credence
D.Wheater, IBM
H.-J.Wunderlich, U. Stuttgart

For more information, visit us on the web at: http://tab.computer.org/tttc/teg/ttep

The Test Technology Educational Program 2007 (TTEP 2007) is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC).


IEEE Computer Society- Test Technology Technical Council

TTTC CHAIR
André IVANOV
University of British Columbia - Canada
Tel. +1-604-822-6936
E-mail ivanov@ece.ubc.ca

SENIOR PAST CHAIR
Yervant ZORIAN
Virage Logic - USA
Tel. +1-510-360-8035
E-mail yervant.zorian@viragelogic.com

TTTC 2ND VICE CHAIR
Joan FIGUERAS
Universitat Politècnica de Catalunya - Spain
Tel. +34-93-401-6603
E-mail figueras@eel.upc.es

FINANCE
Adit D. SINGH
Auburn University - USA
Tel. +1-334-844-1847
E-mail adsingh@eng.auburn.edu

DESIGN & TEST MAGAZINE
Tim CHENG
University of California, Santa Barbara - USA
Tel. +1-805-893-72942
E-mail timcheng@ece.ucsb.edu

TECHNICAL MEETINGS
Chen-Huan CHIANG

Lucent Technologies
- USA
Tel. +1-732-949-5539
E-mail chenhuan@lucent.com

TECHNICAL ACTIVITIES
Victor Hugo CHAMPAC
Instituto Nacional de Astrofisica - Mexico
Tel.+52-22-470-517
E-mail champac@inaoep.mx

ASIA & SOUTH PACIFIC
Hideo FUJIWARA
Nara Institute of Science and Technology - Japan
Tel. +81-74-372-5220
E-mail fujiwara@is.aist-nara.ac.jp

LATIN AMERICA
Marcelo LUBASZEWSKI
Federal University of Rio Grande do Sul - Brazil
Tel. +34-93-401-6603
E-mail luba@vortex.ufrgs.br

NORTH AMERICA
William R. MANN
Tel. +1-949-645-3294
E-mail william.mann@ieee.org

COMMUNICATIONS
Adit D. SINGH
Auburn University - USA
Tel. +1-334-844-1847
E-mail adsingh@eng.auburn.edu

INDUSTRY ADVISORY BOARD
Yervant ZORIAN
Virage Logic - USA
Tel. +1-510-360-8035
E-mail yervant.zorian@viragelogic.com

 

PAST CHAIR
Paolo PRINETTO
Politecnico di Torino - Italy
Tel. +39-011-564-7007
E-mail Paolo.Prinetto@polito.it

TTTC 1ST VICE CHAIR
Adit D. SINGH
Auburn University - USA
Tel. +1-334-844-1847
E-mail adsingh@eng.auburn.edu

SECRETARY
Christian LANDRAULT
LIRMM - France
Tel. +33-4-674-18524
E-mail landrault@lirmm.fr

INTERNATIONAL TEST CONFERENCE
Jill E. SIBERT
Raspberry Comm.
- USA
Tel. +1-484-894-1111
E-mail jill_sibert@raspberrycom.com

TEST WEEK COORDINATION
Yervant ZORIAN
Virage Logic - USA
Tel. +1-510-360-8035
E-mail yervant.zorian@viragelogic.com

TUTORIALS AND EDUCATION
Dimitris GIZOPOULOS

University of Piraeus
- Greece
Tel. +30-210-414-2372
E-mail dgizop@unipi.gr

STANDARDS
Rohit KAPUR

Synopsys
- USA
Tel. +1-650-934-1487
E-mail rkapur@synopsys.com

EUROPE
Zebo PENG
Linköping University - Sweden
Tel. +46-13-282-067/-281-000
E-mail zpe@ida.liu.se

MIDDLE EAST & AFRICA
Ibrahim HAJJ
American University of Beirut - Lebanon
Tel. +961-1-341-952
E-mail ihajj@aub.edu.lb

STANDING COMMITTEES
Michael NICOLAIDIS
TIMA Laboratory - France
Tel. +33-4-765-74696
E-mail michael.nicolaidis@imag.fr

ELECTRONIC MEDIA
Alfredo BENSO
Politecnico di Torino - Italy
Tel. +39-011-564-7080
E-mail alfredo.benso@polito.it


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