TTTC's Electronic Broadcasting Service
IOST3, WTW, & TTEP TUTORIALS
Held in conjunction with
CALL FOR PARTICIPATION
IEEE INTERNATIONAL WORKSHOP on OPEN SOURCE TEST TECHNOLOGY TOOLS
The IOST3 workshop supports a community of practice focused on open source and open interface tools for test, quality assurance, and reliability estimation of electronic devices, assemblies, and systems.
This year's Workshop will focus on data management – test vector standards, datalogs, validation and analytical tools, and particularly on the aggregation and correlation of data from disparate sources that effective collaboration can provide. Design data for IC's, subassemblies, and systems, failure and repair reports, and production equipment histories all play a role in identifying root causes and improving reliability. The warp and woof of collaboration and competition create the fabric of civilization's progress, and the Open Source milieu has been found to provide a dramatic new means to facilitate that progress. IOST3 is exploring that milieu for the benefit of semiconductor and system test in a worldwide community.
For more information, visit us on the web at: http://iost3.org/
The IOST3 2007: IEEE International Workshop on Open Source Test Technology Tools is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC).
6th IEEE WORKSHOP on TEST of WIRELESS CIRCUITS and SYSTEMS
The Wireless Test Workshop (WTW2007) is an IEEE-sponsored workshop devoted to exploring all issues relating to the design and especially test of wireless circuits and systems. The workshop will be held the day before the VLSI Test Symposium (VTS) 2007.
For more information, visit us on the web at: http://www.wtw2007.tec.ufl.edu/
The 6th IEEE Workshop on Test of Wireless Circuits and Systems (WTW 2007) is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC).
TTTC Test Technology Educational Program
VTS 2007: IEEE VLSI Test Symposium 2007 (VTS 07)
May 6-10 2007, Berkeley, California, USA
Registration and tutorials information is available on http://www.tttc-vts.org
For more information on VTS 2007, visit us on the web at: http://www.tttc-vts.org
IEEE Computer Society- Test Technology Technical Council
TTTC 2ND VICE CHAIR
DESIGN & TEST MAGAZINE
& SOUTH PACIFIC
1ST VICE CHAIR
EAST & AFRICA
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