TTTC's Electronic Broadcasting Service
2007 Friday Workshop on
Friday April 20, 2007
CALL FOR PARTICIPATION
The Design, Automation, and Test in Europe conference and exhibition is the main European event bringing together designers and design automation users, researchers and vendors, as well as specialists in hardware and software design, test and manufacturing of electronic circuits and systems. The conference includes plenary invited papers, regular papers, panels, hot-topic sessions, tutorials and workshops, two special focus days and a track for executives. Friday Workshops are focusing on emerging research and application topics. At DATE 2007, one of the Friday Workshops is devoted to Diagnostic Services in Network-on-Chips. This one-day event consists of a plenary keynote, regular and poster presentations, and a panel session.
Network-on-Chips (NoCs) are emerging as a new on-chip communication paradigm. Diagnostic services, such as test, debug, and on-line monitoring, are becoming an important factor in designing next-generation NoC-based systems. The NoC infrastructure itself requires diagnostic services, and can also be used to support those for the entire system. Although significant research has been done in NoC design, there are many open and pressing issues regarding diagnostic services. The focus of this workshop is to explore them and their implications on system design.
The workshop program contains the following elements.
|Participation & Registration
|You are invited to participate in the workshop. Participation requires registration and a registration fee. Discounted registration is available through the DATE'07 web site only until March 21, 2007. Full-fee registration will also be possible on-site in Nice, France. Check the DATE web site (http://www.date-conference.com/registration/) for rates and other information. Registration includes luncheon, coffee breaks, and an electronic version of the Workshop's Digest of Contributions, containing extended abstracts, papers, slides, posters.
Poster Sessions 1 and 2
For more information, visit us on the web at:
The Design, Automation and Test in Europe Conference and Exhibition (DATE 2007) is sponsored by the European Design and Automation AsSoCiation, the EDA Consortium, the IEEE Computer SoCiety (TTTC), (CEDA), ECSI, RAS and ACM SIGDA.
IEEE Computer Society- Test Technology Technical Council
TTTC 2ND VICE CHAIR
DESIGN & TEST MAGAZINE
& SOUTH PACIFIC
1ST VICE CHAIR
EAST & AFRICA
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