TTTC's Electronic Broadcasting Service
Test Workshop (SWTW 2007)
CALL FOR PRESENTATIONS
The SWTW is the only IEEE/CS sponsored event that focuses on all the aspects associated with microelectronic wafer and die level testing. The conference has a mixture of manufacturer and vendor presentations. It is not a sales show, nor an academic or theoretical conference. It is a probe technology forum where attendees come to learn about recent developments in the industry and exchange ideas. There is a relaxed atmosphere with social activities and plenty of time for informal discussion and networking.
Topics for this year will include:
Please submit a 250-word abstract (MS-Word format) for a 25-minute presentation (no technical paper) by March 2, 2007, to firstname.lastname@example.org. Please include the presentation title and the primary author contact information. The authors of accepted presentations will be notified by March 30, 2007. For 2007, a MS-PowerPoint presentation template will be provided to the authors, and the completed presentations must be received by no later May 21, 2007, for inclusion in the program
Select presentations from SWTW-2007 will be eligible for presentation during a special Technical Session during SEMICON-West 2007!
For more information, please contact either:
For more information, visit us on the web at: http://www.swtest.org
The SW Test Workshop (SWTW 2007) is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC).
IEEE Computer Society- Test Technology Technical Council
TTTC 2ND VICE CHAIR
DESIGN & TEST MAGAZINE
& SOUTH PACIFIC
1ST VICE CHAIR
EAST & AFRICA
This message contains public information only. You are invited to copy and distribute it further.
To remove your name from this mailing list, please email email@example.com or login to the TTTC Database and uncheck the EBS (Electronic Broadcast Service) box, which can modified by selecting "Edit" next to "My Subscriptions".