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22nd IEEE International Symposium on Defect and Fault Tolerance in VLSI
CALL FOR PAPERS
This symposium provides an open forum for presentations in the field of defect and fault tolerance in VLSI systems inclusive of emerging technologies. One of the unique features of this symposium is to combine new academic research with state-of-the-art industrial data, necessary ingredients for significant advances in this field. All aspects of design, manufacturing, test, reliability, and availability that are affected by defects during manufacturing and by faults during system operation are of interest. The topics include (but are not limited to) the following ones:
Prospective authors should prepare an extended summary or the full paper (up to 9 pages in the IEEE 6X9 format), to be submitted as PDF file. Uncompressed unencapsulated postscript may also be used when necessary. Submission should be done electronically. Detailed information about the submission process will be made available on the symposium web page:
We are also interested in panel sessions that involve industrial experiences: please send an email to the Program Chairs with a brief description (1 page maximum) of the panel discussion you would like to propose.
Paper Publication and Presenter Registration:
Each accepted paper MUST have at least an author with a paid full registration for the manuscript to be included and published in the proceedings; an author is also expected to attend and present the paper at the Symposium.
Journal Special Issue:
Best Paper Award:
Prospective authors should adhere to the following deadlines:
For general information, contact the General co-Chairs. For paper submission information, contact the Program co-Chairs.
DFT’07 will be held at the Best Western Universo Hotel located in the center of beautiful city of Rome, a UNESCO world heritage site which hosts some of the world's best known works of art and monuments.
Local Arrangement co-Chairs
Jacob Abraham, Univ. of Texas, USA
For more information, visit us on the web at: http://www.dfts.org
The 22nd IEEE International
Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'07) is sponsored
by the Institute of Electrical and Electronics Engineers (IEEE) Computer
Society's Fault-Tolerant Computing Technical Committee and Test Technology
Technical Council (TTTC).
IEEE Computer Society- Test Technology Technical Council
DESIGN & TEST MAGAZINE
& SOUTH PACIFIC
1ST VICE CHAIR
EAST & AFRICA
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