TTTC's Electronic Broadcasting Service
CALL FOR PRESENTATIONS & PARTICIPATION
Submission Deadline Extended to February 28, 2007!
The background of this event is the continuing struggle with interoperability issues experienced in the flow and management of test data for semiconductor and system debug, diagnosis, yield learning, maintenance, and reliability.
Test is no longer the simple application of vectors to an IC or a board. Test has now expanded to include
IOST3 provides a forum for the discussion of open source tools, open APIs, open databases and data architectures, and open processes to allow companies to more effectively use test information to improve quality and profitability.
Potential Presentation Topics
To present at the Workshop, please submit an extended abstract of about 150 words by E-mail to the Program Chair – in addition, a URL to the relevant Open Source tool would be very useful, and brief laptop demos are encouraged. Each submission should include the full name of each author or other technical contributor, affiliation, telephone number and email address. Please also identify the presenter.
Please visit our website at http://IOST3.org/
Erik Jan Marinissen
Matteo Sonza Reorda
For more information, visit us on the web at: http://IOST3.org/
The IOST3 - 2007: IEEE International Workshop on Open Source Test Technology Tools is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC).
IEEE Computer Society- Test Technology Technical Council
DESIGN & TEST MAGAZINE
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