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International Workshop on Current & Defect Based Testing (DBT)
Held in Conjunction with ITC Test Week (ITC 2006)
CALL FOR PARTICIPATION
Defective parts are due to either systematic or random manufacturing defects. As new processes with new manufacturing steps evolve and new structures are meanwhile being developed, new defect mechanisms arise. To develop more appropriate fault models, a good understanding of, and a continuous follow-up on defect mechanisms -both systematic and random- is mandatory to support the manufacturability of today's and tomorrows integrated circuits, fueling defect based test approaches. Increasing design complexity as well as the need to better cope with process variability shifts the focus from pass/fail oriented test to data-based test approaches, exploiting information on the neighborhood to support a better decision making. The requirement to distinguish between good and bad parts in a reliable way, taking into account the need to cope with process variability imposes a data-based defect-based test approach.
The IEEE International Workshop on Current and Defect Based Testing (DBT 2006) is aimed at addressing these issues and others related to “Defect-Based or Data-Based Testing: What’s the difference?” Paper presentations on topics related to the workshop’s theme and to those given below are expected to generate active discussion on the challenges that must be met to ensure high IC quality through the end of the decade.
For more information, visit us on the web at: http://www.cs.colostate.edu/~malaiya/dbt.html
The IEEE International Workshop on Current & Defect Based Testing (DBT) is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC).
IEEE Computer Society– Test Technology Technical Council
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