TTTC's Electronic Broadcasting Service
First IEEE International Design and Test Workshop (IDT'06)
CALL FOR PAPERS
This event provides a unique forum to discuss novel approaches in design, automation and test in the Middle East and Africa (MEA) region for researchers and practitioners in the areas of VLSI design, test and fault tolerance to come together to discuss new research ideas and present new research results. This event will provide the only VLSI Design &Test-specific meeting in the MEA region. The event will run in conjunction with the annual Innovations of IT Conference and in parallel with GITEX, the world’s third largest IT exhibit, with over 100,000+ visitors in 2005. Topics include, but are not limited to, the following:
To present at the Workshop, authors are invited to submit a full paper or extended summary of at least three pages of recent research or best current practices. Each submission should include: title, full name and affiliation of all authors, an abstract of 50 words, and keywords. It should also identify a contact author and include a complete correspondence address, phone number, fax number, and E-mail address. All submissions must be made electronically in PDF or Postscript format via E-mail. Proposals for panels and embedded tutorials are also invited.
Please ensure that your PFD or Postscript file is readable by Acrobat Reader or Ghostview. The submission of a paper or panel proposal will be considered evidence that upon acceptance, the author(s) will present the paper or organize the panel at the workshop.
Submit your paper proposal electronically to: email@example.com
Authors of accepted papers are requested to submit the complete manuscript of the paper, providing the name and contact information of the presenting person, for inclusion in the Digest of Papers, which will be provided to the attendees.
For general information:
North American Liaison
For more information, visit us on the web at: http://www.tttc-idt.org
First IEEE International Design and Test Workshop (IDT'06) is sponsored
by the Institute of Electrical and Electronics Engineers (IEEE) Computer
Society's Test Technology Technical Council (TTTC).
IEEE Computer Society- Test Technology Technical Council
DESIGN & TEST MAGAZINE
& SOUTH PACIFIC
1ST VICE CHAIR
EAST & AFRICA
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