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& Test of Systems-on-Chip for EMC
CALL FOR PARTICIPATION
Recent explosion in the portable electronics market combined with increasingly hostile electromagnetic environment have intensified the need to include noise-immune design and test methods in applicable low-power integrated circuits, in particular for complex microprocessor-based SoCs.
This workshop focuses on the design of embedded systems intended to operate in harsh environments, such as the EM one. The main themes addressed are:
Victor Champac, INAOE - Mexico
Daniel Lupi, INTI - Argentina
EMC Europe2006 Liaison
Ferran Silva, UPC - Spain
For more information, visit us on the web at: http://www.emceurope2006.org/
The Design & Test of Systems-on-Chip for EMC Workshop (EMC Europe2006) is in-concurrence with the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC).
IEEE Computer Society– Test Technology Technical Council
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