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IEEE International Workshop on Silicon Debug and Diagnosis (SDD06)
Held in Conjunction with ITC Test Week (ITC 2006)
PRELIMINARY CALL FOR PAPERS
Troubleshooting how and why circuits and systems fail is important and is rapidly growing in industry significance. Debug and diagnosis may be needed for yield improvement, process monitoring, debugging the design function, failure mode learning for R&D, or just getting a working first prototype. But the detective work can become tricky. Sources of difficulty include circuit complexity, packaging, physical access, shortened product creation cycle, the traditional focus on just pass/fail testing, and missing tool and equipment capabilities. New and efficient solutions for debug and diagnosis will have a much needed and highly visible impact on productivity. The mission and objective of the SDD06 Workshop is to consider all issues related to debug and diagnosis of circuits and systems - from prototype bring-up to volume production.
The topics of interest include, but are not limited to, the following:
The workshop objective is to facilitate a valuable interactive information exchange. Both extended abstracts and full papers are acceptable for submission. Proposals that describe open issues, industry/technology needs or opinions are also welcome.
Proposals for discussion panels and other special sessions are also invited. Please submit a 1 page abstract for these to the web site or contact the Program/Special-Session Chairs.
Authors of best paper submissions will be invited to contribute to an IET Proceedings Special Issue focused on Silicon Debug & Diagnosis.
For general information contact:
For submission & program information contact:
Local Arrangement Chair:
For more information, visit us on the web at: http://evia.ucsd.edu/conferences/sdd/06/index.html
The 3rd IEEE International Workshop on Silicon Debug and Diagnosis (SDD06) is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC).
IEEE Computer Society– Test Technology Technical Council
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