![]() |
TTTC's
Electronic Broadcasting Service |
IEEE
Transactions on VLSI Systems |
CALL
FOR PAPERS |
|
Microprocessors have always been at the leading-edge of integrated circuit (IC) technology in terms of delivered performance and functionality. Continued scaling of MOS devices that constitute the manufacturing fabric has allowed both general purpose processors and embedded processors, typically found in Systems-on-a-Chip (SoC), to grow in functionality, performance and complexity. Manufactured circuits testing technology, that goes hand-in-hand with the design and manufacturing technologies, runs the entire gamut of testing practices and fault models. With explosive growth in transistor count and burgeoning growth in number of failure mechanisms, the tasks of microprocessors and microprocessor-based ICs testing have become more challenging. Effective methodologies for silicon validation and testing from the first stages of silicon prototyping through volume production manufacturing testing and subsequent field operation can benefit from the uniqueness of locally available microprocessor hardware that is typically not found in other designs. Moreover, a processor has exceptional access to every other component of a complex design. The processor’s unique programmability can be used to support the validation and testing of itself as well as of all the surrounding components as they lend the system with a powerful processing engine that can efficiently handle test application and test control algorithms. This special section aims to collect recent advances, methodologies and best practices in the area of autonomous and semi-autonomous validation and testing of microprocessors and microprocessor based systems. Topics of interest referring to microprocessors and processor-based SoCs include (but are not limited to) the following:
|
|
Submissions | |
Authors are encouraged to submit high-quality research contributions that preferably will not require major revisions. The Guest Editors for the Special Section are as follows:
All manuscripts are subject to the standard Transactions on VLSI review process. Prospective authors should submit their manuscripts electronically to the TVLSI Web site http://tvlsi-ieee.manuscriptcentral.com/ and highlight in the “Notes to EIC” that the manuscript is being submitted to the special section on “Autonomous Silicon Validation and Testing of Microprocessors and Microprocessor-based Systems”. Please also send an email to the Guest Editors notifying them of your submission. Instructions on how to submit a paper can be found at http://tvlsi-ieee.manuscriptcentral.com/ and authors can contact Michael Pham at mpham@csee.usf.edu for further assistance.
|
|
For
more information, visit us on the web at: http://tvlsi-ieee.manuscriptcentral.com/ |
IEEE
Computer Society– Test Technology Technical Council |
||
TTTC
CHAIR SENIOR
PAST CHAIR
FINANCE
DESIGN & TEST MAGAZINE
TECHNICAL
MEETINGS TECHNICAL
ACTIVITIES ASIA
& SOUTH PACIFIC LATIN
AMERICA NORTH
AMERICA COMMUNICATIONS INDUSTRY
ADVISORY BOARD |
PAST
CHAIR TTTC
1ST VICE CHAIR SECRETARY INTERNATIONAL
TEST CONFERENCE TEST
WEEK COORDINATION TUTORIALS
AND EDUCATION STANDARDS EUROPE MIDDLE
EAST & AFRICA STANDING
COMMITTEES ELECTRONIC
MEDIA |
This message contains public information only. You are invited to copy and distribute it further. For more information contact the TTTC office or visit http://tab.computer.org/tttc/ To remove your name from this mailing list, please email unsubscribetttc@cemamerica.com or login to the TTTC Database and uncheck the EBS (Electronic Broadcast Service) box, which can modified by selecting "Edit" next to "My Subscriptions". |