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TTTC's
Electronic Broadcasting Service |
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24th
IEEE VLSI TEST SYMPOSIUM (VTS 2006) |
CALL
FOR PARTICIPATION |
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- ADVANCE REGISTRATION DEADLINE EXTENDED UNTIL APRIL 17, 2006 - |
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The IEEE VLSI Test Symposium explores emerging trends and novel concepts in the testing of integrated circuits and systems. The symposium is a leading international forum where many of the world's leading test experts and professionals from both industry and academia join to present and debate key issues in testing. VTS 2006 addresses key trends and challenges in the semiconductor design and manufacturing industries through an exciting program that includes Keynote and Plenary Talks, Technical Paper Sessions, Embedded Tutorials, Panels, Hot Topic Sessions, Full-day Tutorials, co-located Workshops, and the Innovative Practices Track. TECHNICAL PAPER SESSIONS will present the latest research results in test. VTS 2006 technical paper sessions include:
KEYNOTES
INNOVATIVE PRACTICES (IP) TRACK highlights cutting-edge challenges faced by test practitioners, and innovative solutions employed to address them, including:
SPECIAL SESSIONS will include:
FULL-DAY TUTORIALS and WORKSHOPS complement the core technical program of VTS. WORKSHOPS: TUTORIALS:
The social program
at VTS provides an opportunity for informal technical discussions among
participants. Berkeley, California, provides a very attractive backdrop
for all VTS 2006 activities. We are sure that you will find VTS 2006 enlightening,
thought-provoking, rewarding, and enjoyable! |
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For more information on the VTS 2006 Test Event, visit the VTS website at or contact:
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General
Chair Program Chair Vice-General Co-Chairs Vice-Program Co-Chairs New Topics Special Sessions Innovative Practices
Track Publications Publicity Audio/Visual Finance Local Arrangements Past Chair Ex-Officio Program Committee: Steering Committee: |
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For
more information, visit us on the web at: http://www.tttc-vts.org |
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The 24th IEEE VLSI TEST SYMPOSIUM (VTS 2006) is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC). |
IEEE
Computer Society- Test Technology Technical Council |
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