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TTTC's
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13th
International Test Synthesis Workshop (ITSW 2006) |
CALL
FOR PARTICIPATION |
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Theme: Living with Imperfection Growing density has increased the uncertainty of the manufacturing process to the point that it is very difficult to know IC characteristics prior to manufacture. Additional uncertainty is introduced by soft and hard errors accumulated during the lifetime of the IC. Uncertainty can manifest itself directly on the functionality of the chip (i.e. stuck-at, bridging, coupling faults, and etc.) or it can have more subtle impact device parameters such as path delay, clock skew, and leakage. Testing becomes more critical in this context as a tool to characterize parts in terms of their level of functionality. In order to maintain high yield and durability in the field, defects and variations must be tolerated. Test synthesis, the consideration of test during the synthesis process, is essential to satisfy these strict requirements with low impact on design cost. The workshop will consider all aspects of test and test synthesis including, but not limited, to the following topics:
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Monday -- Tuesday -- Wednesday
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Detailed information is available at the conference web-site - http://www.tttc-itsw.org | |||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||||
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STEERING COMMITTEE General Chair
Program Chair
Panels Chair
Publicity Chair
Finance Chair
Local Arrangements Chair
European Liaison
Asian Liaison
Program Committee
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For
more information, visit us on the web at: http://www.tttc-itsw.org |
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The 13th International Test Synthesis Workshop (ITSW 2006) is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC). |
IEEE
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