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TTTC's
Electronic Broadcasting Service |
4th
IEEE International Workshop on Infrastructure IP (I-IP 2006) Held in conjunction with VLSI Test Symposium, 2006 |
CALL
FOR PAPERS |
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The higher level of manufacturing susceptibility and field reliability in today’s SoC require enhanced detection, diagnosis and yield optimization solutions. These solutions necessitate incorporating on-chip infrastructure IP blocks, in addition to the functionality of the SoC. The Infrastructure IP leverages the manufacturing knowledge and feeds back the information into the design phase. This workshop analyzes this key trend and gives the chance to describe a range of infrastructure IP for today's System-on-Chip (SoC) designs. This includes infrastructure IP for test, diagnosis, timing measurement, debugging, test, repair, and fault tolerance. Areas of Interest include but are not limited to
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To
present at the Workshop, authors are invited to submit paper proposals.
The proposals may be extended abstracts (1,000 words) or full papers.
Each submission should include: title, full name and affiliation of all
authors, an abstract of 50 words, and keywords. Also, identify a contact
author and include a complete correspondence address, phone number, fax
number, and e-mail address. Submit your paper proposal to: - Dimitris Gizopoulos, Piraeus U, dgizop@unipi.gr, Tel: +30-210-414-2372 Authors will be notified of the disposition of their papers by March 30, 2006. Authors of accepted papers may submit an illustrated text by April 10, 2006 for inclusion in the Digest of Papers, which will be provided to the attendees. For general information contact:
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General
Chair Vice-General
Chair Program
Chair Finance Publicity
Publication
Chair Panels
Chair Program Committee to include M. Abadir, Freescale |
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For
more information, visit us on the web at: http://www.unipi.gr/iip/ |
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The
4th IEEE International Workshop on Infrastructure IP (I-IP 2006) is sponsored
by the Institute of Electrical and Electronics Engineers (IEEE) Computer
Society's Test Technology Technical Council (TTTC). |
IEEE
Computer Society– Test Technology Technical Council |
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