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![]() | IEEE
International Workshop on |
CALL
FOR PAPERS |
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Objective
-- Scope -- Submissions --
Important Dates -- About Taiwan
and Taipei -- Further Information -- Committees |
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Following the traditions set up by its predecessors, MTDT06 will provide a forum dedicated to the recent advancements of the memory technology, covering topics such as memory device, circuit design, architecture, fabrication process, verification, yield analysis testing/diagnosis/repair for all kinds of memory such as SRAM, DRAM, Flash memory, EPROM, EEPROM, embedded memories, 3-D memories, content addressable memories, etc. | |
Original contributions related to memory design and test technology are solicited. Topics of interest include, but are not limited to, the following categories:
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Submission
should be made electronically at the workshop web site, i.e., http://larc.ee.nthu.edu.tw/~mtdt06.
A submission should contain a complete manuscript of less than 5000 words
with an abstract of less than 200 words. A submission will be considered
as evidence that once accepted the author(s) will prepare the final manuscript
in time for being included in the proceedings and will present the paper
at the workshop. Papers accepted will be published in a formal proceeding. |
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Taiwan is an island of 36,000 square kilometers, 70% of which are covered by spectacular mountains. With a population of about 23 million, Taiwan is one of the world's major IC design and manufacturing centers. Taipei, a modern city of more than 3 million people, is located in the northern part of Taiwan, and the capital of Taiwan. | |
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Steering Committee Rochit Rajsuman, Advantest,
USA Organizing Committee General Co-Chairs Program Chair Finance Chair Local Arrangements Chair Publications Chair Registration Chair Program Committee Robert Aitken, Artisan, USA |
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For
more information, visit us on the web at: http://larc.ee.nthu.edu.tw/~mtdt06/index.htm |
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The
IEEE International Workshop on Memory Technology, Design, and Testing
(MTDT 2006) is sponsored by the Institute of Electrical and Electronics
Engineers (IEEE) Computer Society's Test Technology Technical Council
(TTTC) Technical Committee on VLSI and the National Tsing-Hua University,
Taiwan in cooperation with the IEEE Solid-State Circuits Society, the
IEEE Circuits and Systems Society, the IEEE Taipei Section, the National
Science Council, Taiwan, and the Ministry of Education, Taiwan. |
IEEE
Computer Society– Test Technology Technical Council |
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